1. Editorial

   • Vishwani D. Agrawal

   Editorial Board Pages: 5 - 5

2. Test Technology Technical Council Newsletter

   • André Ivanov

   News Pages: 7 - 8

3. List of Reviewers

   Legacy Pages: 9 - 10

4. Guest Editorial

   • Victor Champac
   • Ingrid Jansch Porto

   Editorial Board Pages: 11 - 11

5. The ΣΔ-BIST Method Applied to Analog Filters

   • L. Cassol
   • O. Betat
   • M. Lubaszewski

   OriginalPaper Pages: 13 - 20

6. Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard

   • Gladys Omayra Ducoudray-Acevedo
   • Jaime Ramírez-Angulo

   OriginalPaper Pages: 21 - 28

7. Topological Considerations for the Diagnosability Conditions of Analogue Circuits Using a Pair of Conjugate Trees

   • Luis Hernández-Martínez
   • Arturo Sarmiento-Reyes

   OriginalPaper Pages: 29 - 36

8. Multiple Scan Chain Design for Two-Pattern Testing

   • Ilia Polian
   • Bernd Becker

   OriginalPaper Pages: 37 - 48

9. A Unified DFT Approach for BIST and External Test

   • M.-L. Flottes
   • C. Landrault
   • A. Petitqueux

   OriginalPaper Pages: 49 - 60

10. A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems

    • Fabian Vargas
    • Rubem D.R. Fagundes
    • Daniel Barros Jr.

    OriginalPaper Pages: 61 - 72

11. Design Error Diagnosis with Re-Synthesis in Combinational Circuits

    • Raimund Ubar

    OriginalPaper Pages: 73 - 82

12. Assessing the Soft Error Rate of Digital Architectures Devoted to Operate in Radiation Environment: A Case Studied

    • R. Velazco
    • S. Rezgui
    • H. Ziade

    OriginalPaper Pages: 83 - 90