1. Editorial

   • Vishwani D. Agrawal

   Editorial Board Pages: 255 - 255

2. Test Technology Technical Council Newsletter

   • André Ivanov

   News Pages: 257 - 258

3. Guest Editorial

   • Dimitris Nikolos
   • John P. Hayes
   • Cecilia Metra

   Editorial Board Pages: 259 - 260

4. An FPGA-Based Approach for Speeding-Up Fault Injection Campaigns on Safety-Critical Circuits

   • P. Civera
   • L. Macchiarulo
   • M. Violante

   OriginalPaper Pages: 261 - 271

5. Single Output Distributed Two-Rail Checker with Diagnosing Capabilities for Bus Based Self-Checking Architectures

   • Michele Favalli
   • Cecilia Metra

   OriginalPaper Pages: 273 - 283

6. Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System

   • F.M. Gonçalves
   • M.B. Santos
   • J.P. Teixeira

   OriginalPaper Pages: 285 - 294

7. CMOS Differential and Absolute Thermal Sensors

   • Ashish Syal
   • Victor Lee
   • Josep Altet

   OriginalPaper Pages: 295 - 304

8. Using a WLFSR to Embed Test Pattern Pairs in Minimum Time

   • Dimitri Kagaris
   • Spyros Tragoudas

   OriginalPaper Pages: 305 - 313

9. On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST

   • Emmanouil Kalligeros
   • Xrysovalantis Kavousianos
   • Dimitris Nikolos

   OriginalPaper Pages: 315 - 332

10. Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme

    • C. Marzocca
    • F. Corsi

    OriginalPaper Pages: 333 - 342

11. Path-Based Error Coverage Prediction

    • Joakim Aidemark
    • Peter Folkesson
    • Johan Karlsson

    OriginalPaper Pages: 343 - 349

12. Reliability Properties Assessment at System Level: A Co-Design Framework

    • C. Bolchini
    • L. Pomante
    • D. Sciuto

    OriginalPaper Pages: 351 - 356