1. Editorial

   • Vishwani D. Agrawal

   Editorial Board Pages: 367 - 367

2. Test Technology Newsletter

   • André Ivanov

   News Pages: 369 - 370

3. Guest Editorial

   • Michel Renovell

   Editorial Board Pages: 371 - 371

4. New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters

   • Eduardo J. Peralías
   • Adoración Rueda
   • José L. Huertas

   OriginalPaper Pages: 373 - 383

5. Digital Signature Proposal for Mixed-Signal Circuits

   • Anna Maria Brosa
   • Joan Figueras

   OriginalPaper Pages: 385 - 393

6. Frequency Response Verification of Analog Circuits Using Global Optimization Techniques

   • Suresh Seshadri
   • Jacob A. Abraham

   OriginalPaper Pages: 395 - 408

7. Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits

   • Carsten Wegener
   • Michael Peter Kennedy
   • Bernd Straube

   OriginalPaper Pages: 409 - 416

8. Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques

   • Mustapha Slamani
   • Karim Arabi

   OriginalPaper Pages: 417 - 425

9. Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems

   • Hans G. Kerkhoff
   • Hans P.A. Hendriks

   OriginalPaper Pages: 427 - 437

10. Test and Testability of a Monolithic MEMS for Magnetic Field Sensing

    • V. Beroulle
    • Y. Bertrand
    • P. Nouet

    OriginalPaper Pages: 439 - 450