1. SIVA: A System for Coverage-Directed State Space Search

   • Malay Ganai
   • Praveen Yalagandula
   • Vigyan Singhal

   OriginalPaper Pages: 11 - 27

2. Fault Diagnosis of Analog Circuits Using Bayesian Neural Networks with Wavelet Transform as Preprocessor

   • Farzan Aminian
   • Mehran Aminian

   OriginalPaper Pages: 29 - 36

3. Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits

   • Martin Keim
   • Nicole Drechsler
   • Bernd Becker

   OriginalPaper Pages: 37 - 51

4. A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface

   • Iboun Taimiya Sylla
   • Mustapha Slamani
   • Bozena Kaminska

   OriginalPaper Pages: 53 - 61

5. A Reliability Statistics Perspective on the Pitfalls of Standard Wafer-Level Electromigration Accelerated Test (SWEAT)

   • Cher Ming Tan
   • Kelvin Ngan Chong Yeo

   OriginalPaper Pages: 63 - 68

6. Efficient Realization of a Threshold Voter for Self-Purging Redundancy

   • J.M. Quintana
   • M.J. Avedillo
   • J.L. Huertas

   OriginalPaper Pages: 69 - 73