1. Editorial

   • Vishwani D. Agrawal

   OriginalPaper Pages: 215 - 215

2. Hybrid Fault Simulation for Synchronous Sequential Circuits

   • Bernd Becker
   • Martin Keim
   • Rolf Krieger

   OriginalPaper Pages: 219 - 238

3. On Non-Statistical Techniques for Fast Fault Coverage Estimation

   • Michael S. Hsiao

   OriginalPaper Pages: 239 - 254

4. Decentralized BIST Methodology for System Level Interconnects

   • Chauchin Su
   • Shyh-Jye Jou

   OriginalPaper Pages: 255 - 265

5. An Accumulator-Based BIST Approach for Two-Pattern Testing

   • I. Voyiatzis
   • A. Paschalis
   • C. Halatsis

   OriginalPaper Pages: 267 - 278

6. Random Pattern Testability of Control and Address Circuitry of an Embedded Memory with Feed-Forward Data-Path Connections

   • Jacob Savir

   OriginalPaper Pages: 279 - 296

7. Tree-Structured Linear Cellular Automata and Their Applications in BIST

   • Jin Li
   • Xiaoling Sun

   OriginalPaper Pages: 297 - 300