A Survey of Test Techniques for MCM Substrates Madhavan SwaminathanBruce KimAbhijit Chatterjee OriginalPaper Pages: 27 - 38
Electron Beam Probing—A Solution for MCM Test and Failure Analysis R. SchmidR. SchmittM. Sturm OriginalPaper Pages: 55 - 63
MCM Test Strategy Synthesis from Chip Test and Board Test Approaches Andrew Flint OriginalPaper Pages: 65 - 76
Designing “Dual Personality” IEEE 1149.1 Compliant Multi-Chip Modules Najmi Jarwala OriginalPaper Pages: 77 - 86
Design-For-Test in a Multiple Substrate Multichip Module Joel A. JorgensonRussell J. Wagner OriginalPaper Pages: 97 - 107
A Test Methodology for High Performance MCMs Thomas M. StoreyBruce McWilliam OriginalPaper Pages: 109 - 118
A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules Ken Posse OriginalPaper Pages: 119 - 125
Multichip Module Diagnosis by Product-Code Signatures P. NagvajaraJ. LinC. Wang OriginalPaper Pages: 127 - 136
Simulation Techniques for the Manufacturing Test of MCMs Mick TegethoffTom Chen OriginalPaper Pages: 137 - 149
Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die Cynthia F. MurphyMagdy S. AbadirPeter A. Sandborn OriginalPaper Pages: 151 - 166