Volume 1, Issue 4 | Journal of Electronic Testing

Search all Journal of Electronic Testing articles

Volume 1, Issue 4

January 1991

Filter by

Volume:

Sort by

Date published:

New to old Old to new

6 articles in this issue

Editorial

EditorialNotes Pages: 243 - 243
The probability of error detection in sequential circuits using random test vectors
Asad A. Ismaeel
Melvin A. Breuer
OriginalPaper Pages: 245 - 256
Shorts in self-checking circuits
M. Nicolaidis
OriginalPaper Pages: 257 - 273
A characterization of robust test-pairs for stuck-open faults
Sreejit Chakravarty
OriginalPaper Pages: 275 - 286
A methodology for testability enhancement at layout level
J. P. Teixeira
I. C. Teixeira
J. Gonçalves
OriginalPaper Pages: 287 - 299
Ring-like testing of digital circuits
I. P. Litikov
OriginalPaper Pages: 301 - 304