1. Editorial

   EditorialNotes Pages: 243 - 243

2. The probability of error detection in sequential circuits using random test vectors

   • Asad A. Ismaeel
   • Melvin A. Breuer

   OriginalPaper Pages: 245 - 256

3. Shorts in self-checking circuits

   • M. Nicolaidis

   OriginalPaper Pages: 257 - 273

4. A characterization of robust test-pairs for stuck-open faults

   • Sreejit Chakravarty

   OriginalPaper Pages: 275 - 286

5. A methodology for testability enhancement at layout level

   • J. P. Teixeira
   • I. C. Teixeira
   • J. Gonçalves

   OriginalPaper Pages: 287 - 299

6. Ring-like testing of digital circuits

   • I. P. Litikov

   OriginalPaper Pages: 301 - 304