Congratulations to the authors of Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function! Don't miss the article, which will be available for free for a temporary two month period.
JETT has welcomed three new editors! Check out their bios here.
Congratulations to the authors of Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects! Don't miss the article, which is open access, and learn more about the authors here.
The Journal of Electronic Testing: Theory and Applications extends a warm welcome to new editors Dr. Jie Han and Dr. Aibin Yan. Learn more about them here!
Exemplary papers chosen and presented each year at the International Test Conference.
