Journal of Electronic Testing - JETTA/TTTC BEST PAPER AWARDS
2021 Winning Paper
Evaluation of Single Event Upset Susceptibility of FinFET‑based SRAMs with Weak Resistive Defects
2020 Winning Paper
A Novel Approach of Data Content Zeroization Under Memory Attacks
2018 Winning Paper
Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories
2017 Winning Paper
2016 Winning Paper
Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing
2015 Winning Paper
2014 Winning Paper
Access Port Protection for Reconfigurable Scan Networks
2013 Winning Paper