Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection Vijaypal Singh RathorDeepak SinghMohit Sajwan OriginalPaper 16 June 2023 Pages: 371 - 385
Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing Benedikt JooßDieter Schramm OriginalPaper Open access 03 June 2023 Pages: 267 - 274
Incomplete Testing of SOC Kunwer Mrityunjay SinghJatindra DekaSantosh Biswas OriginalPaper 29 May 2023 Pages: 387 - 402
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations K. CouliéH. AzizaW. Rahajandraibe OriginalPaper 25 May 2023 Pages: 275 - 288
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits Pradeep Kumar Biswal OriginalPaper 24 May 2023 Pages: 323 - 346
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems Sabyasachi DeyatiBarry MuldreyAbhijit Chatterjee OriginalPaper 18 May 2023 Pages: 303 - 322
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets Zhengfeng HuangHao WangAibin Yan OriginalPaper 09 May 2023 Pages: 289 - 301
Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network Wenjing TangJing SuYuchan Gao OriginalPaper Open access 29 April 2023 Pages: 129 - 140
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift Hui JiangFanchen ZhangTheodore Manikas OriginalPaper Open access 25 April 2023 Pages: 227 - 243
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation Tai SongZhengfeng HuangKrstic Milos OriginalPaper 25 April 2023 Pages: 189 - 205
Design of INV/BUFF Logic Locking For Enhancing the Hardware Security R. NaveenkumarN. M. SivamangaiS. V. Ashika OriginalPaper 05 May 2023 Pages: 141 - 153
Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications Tommaso MelisEmmanuel SimeuLuc Saury OriginalPaper 28 March 2023 Pages: 171 - 187
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits H. El BadawiF. AzaisF. Lefevre OriginalPaper 27 March 2023 Pages: 155 - 170
A Tunable Concurrent BIST Design Based on Reconfigurable LFSR Ahmad MenbariHadi Jahanirad OriginalPaper 06 March 2023 Pages: 245 - 262
Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey Bahareh AsadiSyed Maqsood ZiaAsghar Mohamadian OriginalPaper 28 February 2023 Pages: 11 - 25
Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation Sourav GhoshSurajit Kumar RoyChandan Giri OriginalPaper 27 February 2023 Pages: 89 - 102
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing Isaac BrucePraise O. FarayolaDegang Chen OriginalPaper 21 February 2023 Pages: 57 - 69
Multiple Retest Systems for Screening High-Quality Chips Chung-Huang YehJwu E. Chen OriginalPaper 20 February 2023 Pages: 207 - 225
Journal of Electronic Testing: Theory and Applications New Editors – 2023 Announcement 10 February 2023 Pages: 3 - 4
Identifying Resistive Open Defects in Embedded Cells under Variations Zahra Paria Najafi-HaghiHans-Joachim Wunderlich OriginalPaper Open access 09 February 2023 Pages: 27 - 40
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram Xiaozhi DuJinjin ZhangYanrong Zhou OriginalPaper 03 February 2023 Pages: 71 - 88
Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm Raghavendra Kumar SakaliNoor Mahammad Shak OriginalPaper 29 March 2023 Pages: 111 - 122
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends Jake ElliotJason Brown OriginalPaper Open access 23 January 2023 Pages: 103 - 110
Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit Wenrun XiaoJidong DiaoDonghui Guo Letter 10 January 2023 Pages: 41 - 55
Design and Evaluation of XOR Arbiter Physical Unclonable Function and its Implementation on FPGA in Hardware Security Applications R. NaveenkumarN. M. SivamangaiS. Sridevi Sathya Priya OriginalPaper 17 December 2022 Pages: 653 - 666
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing Praise O. FarayolaIsaac BruceDegang Chen OriginalPaper 13 December 2022 Pages: 637 - 651
A CatBoost Based Approach to Detect Label Flipping Poisoning Attack in Hardware Trojan Detection Systems Richa SharmaG. K. SharmaManisha Pattanaik OriginalPaper 07 December 2022 Pages: 667 - 682
Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing S. S. Vinod ChandraS. Saju SankarH. S. Anand OriginalPaper 02 December 2022 Pages: 623 - 636
A Complete Design-for-Test Scheme for Reconfigurable Scan Networks Natalia LylinaChih-Hao WangHans-Joachim Wunderlich OriginalPaper Open access 19 January 2023 Pages: 603 - 621
Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing Countries Jean de Dieu Nguimfack-NdongmoKevin Kentsa ZanaGodpromesse Kenné OriginalPaper 01 December 2022 Pages: 589 - 602
Effect of Sizing and Scaling on Power Dissipation and Resilience of an RHBD SRAM Circuit Neha PannuNeelam Rup PrakashJasbir Kaur OriginalPaper 18 November 2022 Pages: 579 - 587
Efficient Design of Rounding-Based Approximate Multiplier Using Modified Karatsuba Algorithm E. Jagadeeswara RaoK. Tarakeswara RaoR. Trinadh OriginalPaper 17 October 2022 Pages: 567 - 574
Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function Zhi-Wei LaiPo-Hua HuangKuen-Jong Lee OriginalPaper 14 October 2022 Pages: 511 - 525
AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking Yadi ZhongAyush JainUjjwal Guin OriginalPaper 03 November 2022 Pages: 527 - 546
Self Healing Controllers to Mitigate SEU in the Control Path of FPGA Based System: A Complete Intrinsic Evolutionary Approach S DeepanjaliNoor Mahammad Sk OriginalPaper 28 September 2022 Pages: 547 - 565
A Review of Various Defects in PCB V. Udaya SankarGayathri LakshmiY. Siva Sankar OriginalPaper 23 September 2022 Pages: 481 - 491
Achieving Agility in Projects Through Hierarchical Divisive Clustering Algorithm Janani VarunR. A. Karthika OriginalPaper 23 September 2022 Pages: 471 - 479
Influence of Printed Circuit Board Dynamics on the Fretting Wear of Electronic Connectors: A Dynamic Analysis Approach Sushil DorangaJenny ZhouRam Poudel OriginalPaper 10 September 2022 Pages: 493 - 510
Automated Design Error Debugging of Digital VLSI Circuits Mohammed MonessLamya GaberHanafy M. Ali OriginalPaper Open access 31 August 2022 Pages: 395 - 417
