Selecting measurements to test the functional behavior of analog circuits J. Van SpaandonkT. A. M. Kevenaar OriginalPaper Pages: 9 - 18
A unified approach for fault simulation of linear mixed-signal circuits Ashok BalivadaHong ZhengJacob A. Abraham OriginalPaper Pages: 29 - 41
Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets S. MirM. LubaszewskiB. Courtois OriginalPaper Pages: 43 - 57
Optimization-based multifrequency test generation for analog circuits A. AbderrahmanB. KaminskaE. Cerny OriginalPaper Pages: 59 - 73
Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits J. Machado da SilvaJ. Silva MatosGaynor E. Taylor OriginalPaper Pages: 75 - 88
Signature analysis for fault detection of mixed-signal ICs based on dynamic power-supply current Javier ArgüellesSalvador Bracho OriginalPaper Pages: 89 - 107
A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI Johan VerfaillieDidier Haspeslagh OriginalPaper Pages: 109 - 115
A BIST-DFT technique for DC test of analog modules Christian DufazaHassan Ihs OriginalPaper Pages: 117 - 133
Unified built-in self-test for fully differential analog circuits S. MirM. LubaszewskiB. Courtois OriginalPaper Pages: 135 - 151
Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis Yingquan ZhouMike W. T. WongYinghua Min OriginalPaper Pages: 153 - 163
A data optimization test technique for characterizing embedded ADCs J. RaczkowyczS. AllottT. I. Pritchard OriginalPaper Pages: 165 - 175
Reconstruction method for jitter tolerant data acquisition system Adel BelhaouaneYvon SavariaDaniel Massicotte OriginalPaper Pages: 177 - 185
Parametric testing of mixed-signal circuits by ANN processing of transient responses Andrzej MaterkaMichal Strzelecki OriginalPaper Pages: 187 - 202
Test and diagnosis of analog circuits: When fuzziness can lead to accuracy Firas MohamedMeryem Marzouki OriginalPaper Pages: 203 - 216
