Skip to main content
Log in
Search all Journal of Electronic Testing articles

Volume 20, Issue 4

August 2004

Special Issue on the Third IEEE Latin-American Test Workshop

Issue Editors:
  • F. Vargas,
  • V. Champac
14 articles in this issue
  1. Editorial

    • Vishwani D. Agrawal
    Editorial Introduction Pages: 327 - 327
  2. Guest Editorial

    • Fabian Vargas
    • Victor Champac
    Editorial Introduction Pages: 331 - 332

Navigation