Extended selection of switching target faults in CONT algorithm for test generation Yuzo TakamatsuKozo Kinoshita OriginalPaper Pages: 183 - 189
Extended selection of switching target faults in CONT algorithm for test generation Yuzo TakamatsuKozo Kinoshita OriginalPaper Pages: 183 - 189
Feedback-testing by using multiple input signature registers Martin Rudolph OriginalPaper Pages: 213 - 219
Feedback-testing by using multiple input signature registers Martin Rudolph OriginalPaper Pages: 213 - 219
Finite state machine synthesis with embedded test function Vishwani D. AgrawalKwang-Ting Cheng OriginalPaper Pages: 221 - 228
Finite state machine synthesis with embedded test function Vishwani D. AgrawalKwang-Ting Cheng OriginalPaper Pages: 221 - 228
Exact probabilistic testability measures for multi-output circuits P. CamuratiP. PrinettoM. Sonza Reorda OriginalPaper Pages: 229 - 234
Exact probabilistic testability measures for multi-output circuits P. CamuratiP. PrinettoM. Sonza Reorda OriginalPaper Pages: 229 - 234
Probabilistic fault grading based on activation checking and observability analysis Masahisa NakazawaSusumu NittaKanji Hirabayashi OriginalPaper Pages: 235 - 238
Probabilistic fault grading based on activation checking and observability analysis Masahisa NakazawaSusumu NittaKanji Hirabayashi OriginalPaper Pages: 235 - 238