AES-depth-profiling of thin annealed Pt-films on Si(100) C. HarderA. EmsermannK. Müller OriginalPaper Pages: 239 - 243
XTEM, ellipsometric and ARXPS study of a-SiOx and a-Ge thin films on silicon substrates S. HucekJ. ZemekP. Široký OriginalPaper Pages: 245 - 253
Reliable surface reconstruction from stereo pairs of images provided by scanning electron microscope D. Janová OriginalPaper Pages: 255 - 260
Measurement of the transmission function of the hemispherical energy analyser of ADES 400 electron spectrometer P. Jiříček OriginalPaper Pages: 261 - 267
Separator of primary and signal electrons for very low energy SEM D. PejchlI. MüllerováV. Kolařík OriginalPaper Pages: 269 - 276
Monte Carlo calculations of electron scattering in solids for nuclear spectroscopy A. ŠpalekO. Dragoun OriginalPaper Pages: 277 - 282
SEM, EDX and AES analysis of embrittled CrNiMo steel J. ŠubaJ. KaslV. Liška OriginalPaper Pages: 283 - 286
The innovation facilities of Auger spectrometer with energy modulation on CMA S. TomekJ. LidayP. Vogrinčič OriginalPaper Pages: 287 - 293
AES investigations of growth of very thin silver films deposited on the copper and nickel (110) faces M. ZagórskiM. NowickiS. Mróz OriginalPaper Pages: 295 - 300