Improving the testability of switched-capacitor filters J. L. HuertasA. RuedaD. Vázquez OriginalPaper Pages: 199 - 213
Enhancing design-for-test for active analog filters by using CLP(ℜ) Franc NovakIgor MozetiČAnton Biasizzo OriginalPaper Pages: 215 - 229
Multiple fault analog circuit testing by sensitivity analysis Naim Ben HamidaBozena Kaminska OriginalPaper Pages: 231 - 243
Fault simulation of linear analog circuits Naveena NagiAbhijit ChatterjeeJacob A. Abraham OriginalPaper Pages: 245 - 260
A hierarchical analog test bus framework for testing mixed-signal integrated circuits and printed circuit boards Nai-Chi Lee OriginalPaper Pages: 261 - 268
A structure for interconnect testing on mixed-signal boards B. R. WilkinsB. S. Suparjo OriginalPaper Pages: 269 - 274