Abstract
Surface roughness is commonly used to characterize material microstructure during processing, and accurate measurement of surface roughness is the premise and foundation of machining. Therefore, online non-destructive measurement of surface roughness based on the laser speckle method has become a hot issue in recent research. The improvements in surface roughness measurements based on the laser speckle method are systematically reviewed. Theory of speckle formation is introduced. The statistical properties of the speckle patterns including first-order statistical properties and second-order statistical properties are directly related to surface roughness. Surface roughness measurements based on the laser speckle method are roughly divided into the speckle contrast method, speckle correlation method, and fractal method. The three methods are described in detail, and an extensive comparison among all the methods is presented. The recent progresses and application of surface roughness measurements are reviewed. Finally, surface roughness measurements based on the laser speckle method are prospected and summarized.
Similar content being viewed by others
References
C. Wang, D. Lv, H. Shi, X. Liu, R. Xin, in: C. Zhang, A. Asundi (Eds.), Proceedings of SPIE, 2nd International Conference on Photonics and Optical Engineering, Xi’an, China, 2017, 1025654.
Y. Gong, J. Xu, R.C. Buchanan, Phys. Sci. Rev. 3 (2018) 20170057.
H. Yi, J. Liu, P. Ao, E. Lu, H. Zhang, Opt. Express 24 (2016) 17215–17233.
Y. Quinsat, C. Tournier, Precision Eng. 36 (2012) 97–103.
S.A. Whitehead, A. Shearer, D.C. Watts, N.H. Wilson, Dent. Mater. 15 (1999) 79–86.
M. Yildirim, T. Okutucu-Ozyurt, Z. Dursunkaya, Opt. Laser Technol. 85 (2016) 19–29.
Y. Gong, S.T. Misture, P. Gao, N.P. Mellott, J. Phys. Chem. C 120 (2016) 22358–22364.
H. Fujii, T. Asakura, Opt. Commun. 11 (1974) 35–38.
X. Du, Y. Wang, Chin. Opt. 13 (2020) 1–13.
J.W. Goodman, Statistical properties of laser speckle patterns, laser speckle & related phenomena, Springer, Berlin, Heidelberg, Germany, 1985.
D. Briers, D.D. Duncan, E. Hirst, S.J. Kirkpatrick, M. Larsson, W. Steenbergen, T. Stromberg, O.B. Thompson, J. Biomed. Opt. 18 (2013) 066018.
J. Senarathna, A. Rege, N. Li, N.V. Thakor, IEEE Rev. Biomed. Eng. 6 (2013) 99–100.
P. Prabhathan, C. Song, A. Haridas, G. Prasad, K. Chan, in: Proceedings of SPIE, Fifth International Conference on Optical and Photonics Engineering, Singapore, 2017, 1044912.
D.R. Patel, M.B. Kiran, IOP Conf. Ser. Mater. Sci. Eng. 895 (2020) 012007.
S.I.M. Suhail, J.M. Ali, H.S. Jailani, M. Murugan, IOP Conf. Ser. Mater. Sci. Eng. 402 (2018) 012054.
F. Rodriguez, I. Cotto, S. Dasilva, P. Rey, K.V. Straeten, Proced. Manufact. 13 (2017) 519–525.
N.A. Mansour, A.M. Abd-Rabou, A.E. Elmahdy, R.M. El-Agmy, M.M. El-Nicklawy, Optik 133 (2017) 140–149.
M. Shimizu, H. Sawano, H. Yoshioka, H. Shinno, Proced. CIRP 33 (2015) 251–256.
H.M. Escamilla, E.R. Méndez, V. Ruiz-Cortés, J.E.A. Landgrave, Opt. Commun. 313 (2014) 195–203.
W. Jing, G. Jiang, J. Zhang, in: 9th IEEE International Conference on Microwave and Millimeter Wave Technology, IEEE, Beijing, China, 2016, pp. 94–96.
D. Joseph, P. Bisnoi, SPIE 8699 (2013) 869911.
T. Jeyapoovan, M. Murugan, B.C. Bovas, in: World Congress on Information and Communication Technologies, IEEE, Trivandrum, India, 2013, pp. 378–382.
A.S.G. Prasad, M.V. Matham, K.H.K. Chan, in: IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, IEEE, Sri Venkateshwara Coll Engn, Dept Elect & Commun Engn, Bengaluru, India, 2016, pp. 908–912.
B.O. Asamoah, M. Roussey, K.E. Peiponen, Chemosphere 254 (2020) 126789.
J.Y. Lee, S. Jeon, S.H. Jang, N.C. Park, Y.J. Kim, Displays 51 (2018) 30–35.
A.L. Sampaio, D.C. Lobao, L.C.S. Nunes, P.A. M.L. Dos Santos, L. Silva, J.A.O. Huguenin, Opt. Laser. Eng. 49 (2010) 32–35.
S. Patzelt, D. Stobener, A. Fischer, Appl. Opt. 58 (2019) 6436–6445.
P. Satapathy, G. Nath, P. Mishra, Laser Phys. 31 (2021) 036001.
X. Chen, C. Cheng, Z. Li, H. Zhang, M. Liu, M. Zhang, Opt. Commun. 329 (2014) 113–118.
M.R.B. Dias, A.O. Castro, C.P. Dias, S.A. De Carvalho, J.A.O. Huguenin, L. Da Silva, Phys. A Statist. Mech. Appl. 534 (2019) 122175.
H.C. Soares, J.B. Meireles, A.O. Castro, J.A.O. Huguenin, A.G.M. Schmidt, L. DaSilva, Phys. A Statist. Mech. Appl. 432 (2015) 1–8.
M.M. El-Nicklawy, A.F. Hassan, A.E. Elmahdy, A.M. Abd-Rabou, E.A. Eesee, OPJ 9 (2019) 96165.
N. Farid, H. Hussein, M. Bahrawi, MAPAN 30 (2015) 125–129.
C. Cui, Z. Wang, X. Zhan, J. Wang, L. Liu, Z. Li, C. Wu, Appl. Opt. 59 (2020) 3630–3635.
A.E. Gorjunov. P.V. Pavlov, N.V. Petrov, in: 1st International Scientific School on Methods of Digital Image Processing in Optics and Photonics, IOP, St Petersburg, Russia, 2014, pp. 536.
F. Poller, L.M. Bilgeri, F.S. Bloise, M. Jakobi, S. Wang, J. Dong, A.W. Koch, in: 33rd Measurement Symposium, TM-Tech Mess, Friedrich Alexander Univ Erlangen Nurnberg, Lehrstuhl Fertigungsmesstechni, Erlangen, Germany, 2019. pp. 5.
R.M. Haralick, K. Shanmugam, I.H. Dinstein, IEEE Trans. Sys. Man Cybernetics SMC-3 (1973) 610–621.
Y. Lei, R. Lu, L. Lei, in: 4th International Seminar on Modern Cutting and Measurement Engineering, SPIE, Beijing, China, 2011, pp. 79971X.
H. Huang, C. Chuang, IEEE Access 8 (2020) 192481–192492.
D.R. Patel, M.B. Kiran, Mater. Today Proceed. 18 (2019) 3008–3016.
A.B. Pradana, P. Prajitno, in: 6th International Conference on Instrumentation, Control, and Automation, IEEE, Institut Teknologi Bandung, Fac Ind Technol, Instrumentat & Control Resch, Bandung, Indonesia, 2019, pp. 100–105.
F. Nirwana, P. Prajitno, S.K. Wijaya, in: International Conference on Electrical, Electronics and Information Engineering, IEEE, Denpasar, Indonesia, 2019, pp. 244–249.
R.P. Dhiren, M.B. Kiran, V. Vakharia, Eng. Rep. 2 (2020) e12119.
D.R. Patel, M.B. Kiran, Mater. Today Proceed. 44 (2021) 792–796.
K. Joshi, B. Patil, Proced. Comput. Sci.167 (2020) 382–391.
D. Youssef, H. El-Ghandoor, H. Kandel, J. El-Azab, S. Hassab-Elnaby, Mater. 10 (2017) 714.
D. Youssef, S. Hassab-Elnaby, H. El-Ghandoor, Plos One 16 (2021) e0246395.
S. Bharathi, M.M. Ratnam, IOP Conf. Ser. Mater. Sci. Eng. 530 (2019) 012022.
V. Kumar, C.P.S. Kumar, Measurement 152 (2020) 107297.
R. Paterson, Index, Texture analysis in materials science: mathematical methods, United State, 1969.
Y. Sun, Research on measuring method of surface roughness for speckle image, Nanjing University of Information Engineering, Nanjing, China, 2018.
H. Hu, Surface roughness measurement based on laser speckle image, Nanjing University of Information Engineering, Nanjing, China, 2015.
Y. Liu, Application research on surface roughness detection of workpiece based on laser speckle image, Shenyang Aerospace University, Shenyang, China, 2019.
L. Yang, R. Lu, Y. Shi, L. Lei, Z. Liu, SPIE 8916 (2014) 89160K.
J. Li, Q. Du, C. Sun, Pattern Recogn. 42 (2009) 2460–2469.
H. Rabal, E. Grumel, N. Cap, L. Buffarini, M. Trivi, Opt. Laser. Eng. 106 (2018) 47–55.
S. Soumya, M.S. Swapna, V. Raj, V. P.M. Pillai, S. Sankararaman, Eur. Phys. J. Plus 132 (2017) 551.
S. Chen, Y. Zhang, H. Hu, Chinese Journal of Lasers 42 (2015) 0408002.
D. Xu, Q. Yang, F. Dong, S. Krishnaswamy, JOE 9 (2018) 773–778.
M.R.B. Dias, D. Dornelas, W.F. Balthazar, J.A.O. Huguenin, L.D. Silva, Phys. A Statist. Mech. Appl. 486 (2017) 328–336.
M.R.B. Dias, D. Dornelas, C.P. Dias, G.C. DeAlmeida, S.A. Carvalho, J.A.O. Huguenin, L.D. Silva, Opt. Laser Technol. 113 (2019) 27–34.
R. Schurch, C. Gonzalez, P. Aguirre, M. Zuniga, I. Iddrissu, Calculating the fractal dimension from 3D images of electrical trees, in: The 20th International Symposium on High Voltage Engineering, Institution of Engineering and Technology, Buenos Aires, Argentina, 2017.
A. Haridas, A. Crivoi, P. Prabhathan, K. Chan, V.M. Murukeshan, SPIE 10449 (2017) UNSP 104491T.
J.W. Goodman, Speckle phenomena in optics: theory and applications, SPIE, US, 2007.
C. Liu, Q. Dong, H. Li, Z. Li, X. Li, C. Cheng, Opt. Express, 22 (2014) 1302–1312.
B. Dhanasekar, N.K. Mohan, N.B. Bhaduri, B. Ramamoorthy, Precision Eng. 32 (2007) 196–206.
S.L. Toh, C. Quan, K.C. Woo, C.J. Tay, H.M. Shang, Opt. Laser. Technol. 33 (2001) 427–434.
B. Ruffing, JOSA 3 (1986) 1297–1304.
G.S. Spagnolo, D. Paoletti, Opt. Commun. 132 (1996) 24–28.
D. Leger, E. Mathieu, J.C. Perrin, Appl. Opt. 14 (1975) 872–877.
U. Persson, J. Mater. Process. Technol. 180 (2006) 233–238.
E. Baradit, C. Gatica, M. Yaez, J.C. Figueroa, C. Catalan, Opt. Laser. Eng. 128 (2020) 106009.
K. Dev, P. Guru, H. Aswin, P. Prabhathan, M.V. Matham, SPIE 10449 (2017) UNSP104492W.
P. Prabhathan, C. Song, A. Haridas, G. Prasad, K. Chan, SPIE 10449 (2017) UNSP1044912.
S. Lake, J. Rew, C.D. Stacey, J.P. Sargent, SPIE 57 (2015) 513–517.
S.B. Felix, A. Laura, J. Martin, W.K. Alexander, Oldenbourg Wissenschaftsverlag 81 (2014) 289–295.
U. Persson, Wear 160 (1993) 221–225.
J. Peters, A. Schoene, R.H. Bossi, D.M. Pepper, International Society for Optics and Photonics 3399 (1998) 45–56.
C. Joenathan, R. Torroba, R. Henao, Optik 112 (2001) 163–168.
A.F. Fercher, U. Vry, W. Werner, Opt. Laser. Eng. 11 (1989) 271–279.
T. Fricke-Begemann, G. Gulker, K.D. Hinsch, K. Wolff, Appl. Optics 38 (1999) 5948–5955.
G.S. Spagnolo, L. Cozzella. F. Leccese, Measurement 58 (2014) 537–543.
N. Werth, F. Salazar-Bloise, A. Koch, Rev. Sci. Instrum. 85 (2014) 015114.
G. Parry, Opt. Commun. 12 (1974) 75–78.
S. Patzelt, A. Ciossekm, P. Lehmann, A. Schoene, SPIE 3426 (1998) 124–133.
J. Huang, Z.H. Yang, Y.F. Ge, Adv. Mater. Res. 538–541 (2012) 256.
P. Lehmann, Appl. Opt. 41 (2002) 2008–2014.
J. Lettner, B.G. Zagar, Measure. Sci. Technol. 24 (2013) 115204.
T. Jeyapoovan, M. Murugan, B.C. Bovas, in: World Congress on Information and Communication Technologies, 2012, 13228760. https://doi.org/10.1109/WICT.2012.6409106.
C.M. Klassen, J. Emmert, K.J. Daun, IOP Conf. Ser. Mater. Sci. Eng. 967 (2020) 012075.
G. Zhou, C. Mao, M. Tian, Y. Sun, in: 7th International Conference on Management, Education, Information and Control, Advances in Intelligent Systems Research, Shenyang, China, 2018, pp. 330–337.
S. Patzelt, C. Stehno, D. Stöbener, G. Ströbel, A. Fischer, Oldenbourg Wissenschaftsverlag 84 (2017) 557–567.
S. Patzelt, C. Stehno, A. Tausendfreund, G. Stroebel, Oldenbourg Wissenschaftsverlag 83 (2016) 484–493.
A. Fischer, D. Stöbener, CIRP Annals 68 (2019) 523–526.
R. Retheesh, B. Samuel, P. Radhakrishnan, V.P.N. Nampoori, A. Mujeeb, Journal of Aeronautics & Aerospace Engineering 5(2016) 1000157.
R. Balamurugan, R. Prakasam, Laser Eng. 47 (2020) 317–334.
R. Balamurugan, R. Prakasam, Laser Eng. 45 (2020) 325–335.
D. Youssef, J. El-Azab, H. Kandel, S. Hassab-Elnaby, H. El-Ghandoor, Optik 183 (2019) 55–64.
A. Shulev, I. Roussev, S. Karpuzov, G. Stoilov, D. Ignatova, C.V. See, G. Mitov, J. Theoret. Appl. Mech. 46 (2016) 27–36.
S. Sankararaman, Phys. Scripta 97 (2022) 025003.
B. Kim, J. Seo, Appl. Surf. Sci. 359 (2015) 204–208.
N.B. Bhagat, P.P. Padghan, R. Kesarwani, A. Khare, K.M. Alti, Mater. Today Proceed. 50 (2022) 123–128.
P. Padghan, V. Pande, P. Ingle, S. Sen, A. Gade, K. Alti, AIP Conf. Proceed. 2100 (2019) 020062.
Y. Fuh. C. Wang, C. Huang, P. Chen, Z. Lai, Optik 127 (2016) 1349–1353.
J. Pladellorens, O. Cusola, J. Caum, S. Royo, A. Tosas, A. Pino, Appita 67 (2014) 140–144.
A. Pino, J. Pladellorens, Opt. Eng. 7432 (2011) 093605.
P. Singh, G. Nath, Laser Phys. 31 (2021) 076002.
Acknowledgements
This work was supported by the National Key Research and Development Plan (Grant No. 2020YFB1713600), Xinjiang Science and Technology Assistance Program (Grant No. 2021E02060), the Fundamental Research Funds for the Central Universities (Grant No. FRF-TP-20-105A1 and FRF-TP-19-002A3), National Natural Science Foundation of China (Grant No. 51975043), and the China Postdoctoral Science Foundation (Grant No. 2021M69035).
Author information
Authors and Affiliations
Corresponding author
Ethics declarations
Conflict of interest
No author has reported a potential conflict of interest relevant to this article.
Rights and permissions
Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
About this article
Cite this article
Shao, Mq., Xu, D., Li, Sy. et al. A review of surface roughness measurements based on laser speckle method. J. Iron Steel Res. Int. 30, 1897–1915 (2023). https://doi.org/10.1007/s42243-023-00930-8
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s42243-023-00930-8