Abstract
High energy synchrotron diffraction offers great potential to study the recrystallization kinetics of metallic materials. To study the formation of Goss texture ({110}〈001〉) of grain oriented (GO) silicon steel during secondary recrystallization process, an in situ experiment using high energy X-ray diffraction was designed. The results showed that the secondary recrystallization began when the heating temperature was 1,494 K, and the grains grew rapidly above this temperature. With an increase in annealing temperature, the large grains with γ orientation [〈111〉//normal direction] formed and gradually occupied the dominant position. As the annealing temperature increased even further, the grains with Goss orientation to a very large size by devouring the γ orientation grains that formed in the early annealing stage. A single crystal with a Goss orientation was observed in the GO silicon steel when the annealing temperature was 1,540 K.
Similar content being viewed by others
References
C. Gheorghies, A. Doniga, J. Iron Steel Res. Int. 16, 78 (2009)
B.D. Cullity, C.D. Graham, Introduction to Magnetic Materials (Wiley, Hoboken, 2009), p. 453
D. Dorner, S. Zaefferer, L. Lahn, D. Raabe, J. Magn. Magn. Mater. 304, 183 (2006)
T. Kumano, T. Haratani, Y. Ushigami, ISIJ Int. 43, 736 (2003)
N. Chen, S. Zaefferer, L. Lahn, K. Gunther, D. Raabe, Acta Mater. 51, 1755 (2003)
C. Zhang, L. Xiang, T.L. Dong, E.B. Yue, S.T. Qiu, J. Iron Steel Res. 21, 55 (2009). (in Chinese)
M.Q. Yan, P. Yang, Q.W. Jiang, Acta Metall. Sin. 47, 25 (2011). (in Chinese)
H. Li, Y.L. Feng, X.J. Qi, D.Q. Cang, J.L. Liang, Acta Metall. Sin. 49, 562 (2013). (in Chinese)
S. Mishra, C. Darmann, K. Lucke, Acta Metall. 32, 2185 (1984)
S. Nakashima, K. Takashima, J. Harase, ISIJ Int. 31, 1007 (1991)
T. Kumano, T. Haratani, Y. Ushigami, ISIJ Int. 42, 440 (2002)
T. Kumano, T. Haratani, Y. Ushigami, ISIJ Int. 44, 1888 (2004)
H. Homma, B. Hutchinson, Acta Mater. 51, 3795 (2003)
A. Morawiec, Scr. Mater. 64, 466 (2011)
W. Guo, W.M. Mao, J. Mater. Sci. Technol. 26, 759 (2010)
Y.D. Liu, Y.D. Zhang, Y. Ren, A. Tidu, L. Zuo, J. Iron Steel Res. Int. 20, 38 (2013)
R.J. Roe, J. Appl. Phys. 36, 2024 (1965)
J.Y. Park, K.S. Han, J.S. Woo, S.K. Chang, N. Rajmohan, J.A. Szpunar, Acta Mater. 50, 1825 (2002)
S. Zaefferer, N. Chen, Diffus. Defect Data B 105, 29 (2005)
Y. Ushigami, T. Kumano, T. Haratani, S. Takebayashi, S. Kubota, Mater. Sci. Forum 467–470, 853 (2004)
Acknowledgments
This work was financially supported by the Key Projects of the National Science & Technology Pillar Program (No. 2011BAE13B03) and the Fundamental Research Funds for the Central Universities (No. N110502001).
Author information
Authors and Affiliations
Corresponding author
Additional information
Available online at http://link.springer.com/journal/40195
Rights and permissions
About this article
Cite this article
Liu, Y., Jiang, Q., Wang, Y. et al. Goss Texture Evolution of Grain Oriented Silicon Steel by High-Energy X-ray Diffraction. Acta Metall. Sin. (Engl. Lett.) 27, 530–533 (2014). https://doi.org/10.1007/s40195-014-0082-y
Received:
Revised:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s40195-014-0082-y