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Extraction of Process-Structure Evolution Linkages from X-ray Scattering Measurements Using Dimensionality Reduction and Time Series Analysis

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Abstract

The rapid development of robust, reliable, and reduced-order process-structure evolution linkages that take into account hierarchical structure are essential to expedite the development and manufacturing of new materials. Towards this end, this paper lays a theoretical framework that injects the established time series analysis into the recently developed materials knowledge systems (MKS) framework. This new framework is first presented and then demonstrated on an ensemble dataset obtained using small-angle X-ray scattering on semi-crystalline linear low density polyethylene films from a synchrotron X-ray scattering experiment.

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Acknowledgments

DBB and SRK acknowledge support from the NSF-IGERT Award 1258425 and NIST 70NANB14H191. AK and DGB acknowledge support from the ExxonMobil Chemical Company.

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Authors and Affiliations

  1. School of Computational Science and Engineering, Georgia Institute of Technology, North Ave NW, Atlanta, 30332, USA

    David B. Brough & Surya R. Kalidindi

  2. School of Materials Science and Engineering, Georgia Institute of Technology, North Ave NW, Atlanta, 30332, USA

    Abhiram Kannan, David G. Bucknall & Surya R. Kalidindi

  3. H. Milton Stewart School of Industrial & Systems Engineering, Georgia Institute of Technology, North Ave NW, Atlanta, 30332, USA

    Benjamin Haaland

  4. George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, North Ave NW, Atlanta, 30332, USA

    Surya R. Kalidindi

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  1. David B. Brough
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Correspondence to Surya R. Kalidindi.

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Brough, D.B., Kannan, A., Haaland, B. et al. Extraction of Process-Structure Evolution Linkages from X-ray Scattering Measurements Using Dimensionality Reduction and Time Series Analysis. Integr Mater Manuf Innov 6, 147–159 (2017). https://doi.org/10.1007/s40192-017-0093-4

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