Abstract
We report preparation of phase pure BiFeO3 thin films on glass, ITO and Si(100) substrates through chemical route using spin coating technique. Sol-gel process was adopted to prepare the films using bismuth nitrate and iron nitrate as precursors. X-Ray diffraction and Raman spectroscopy studies revealed amorphous nature of the as deposited films. Rhombohedral crystalline phase of BiFeO3 evolved on annealing the films at 500°C, but with Bi2Fe4O9 and Bi24Fe2O39 as impurity phases. Increasing the annealing temperature to 550°C caused a drastic reduction of the impurity phases and at 600°C, the films were phase-pure BiFeO3. Micro Raman spectra showed features consistent with the reported characteristic peaks of BiFeO3 crystalline phase for films annealed at 500 and 550°C. Crystallite size obtained from X-ray diffraction line width analysis are within 30 to 40 nm. Atomic force microscopy (AFM) however showed grain size of ∼192 nm, indicating polycrystalline nature of the grains.
Similar content being viewed by others
References
M Fiebig, T Lottermoser, D Frohlic, A V Goltsev and R V Pisarev Nature 419 818 (2002)
M M Kumar, V R Palkar, K Srinivas and S V Suryanarayana Appl. Phys. Lett. 76 2764 (2000)
N A Hill J. Phys. Chem. B104 6694 (2000)
A Srinivas, D W Kim, K S Hong and S V Suryanarayana Appl. Phys. Lett. 83 2217 (2003)
J Wang, J B Neaton, H Zheng, V Nagarajan, S B Ogale, B Liu, D Viehland, V Vaithyanathan, D G Schlom, U V Waghmare, N A Spaldin, K M Rabe, M Wuttig and R Ramesh Science 299 1719 (2003)
V R Palkar, J John and R Pinto Appl. Phys. Lett. 80 1628 (2002)
J Li, J Wang, M Wuttig, R Ramesh, N Wang, B Ruette, A P Pyatakov, A K Zvezdin and D Viehland Appl. Phys. Lett. 84 5261 (2004)
A G Tutov Fiz Tverd Tela (FTVTA) 11 2681 (1969)
G D Achenbach, R Gerson and W J James J. Am. Ceram. Soc. 50 437 (1967)
S W Lee and C S Kim J. Magn. 10 84 (2005)
C Tabares-Munoz, J P Rivera, A Monnier and H Schmid Jpn. J. Appl. Phys. Part 1 24 1051 (1985)
J R Teague, R Gerson and W J James Solid State Commun. 8 1073 (1970)
Deepti Kothari, V Raghavendra Reddy, Ajay Gupta, D M Phase, N Lakshmi, S K Deshpande and A M Awasthi J. Phys.: Condens. Matter 19 136202 (2007)
Hongri Liu, Zuli Liu, Qing Liu and Kailun Yao Thin Solid Films 500 105 (2006)
E I Speranskaya, V M Skorikov and E Ya Rode Bull. Acad. Sci. USSR, Phys. Ser. 30 874 (1965)
A Maitre, M Francois and J C Gachon Journal of Phase Equilibria and Diffusion Vol.25 No. 1 (2004)
B D Culity Element of X-ray Diffraction (MA Reading: Addison-Wesley) (1978)
M K Singh, H M Jang, S Ryu and M-Ho Jo Appl. Phys. Lett. 88 042907 (2006)
X J Lou, C X Yang, T A Tang, Y Y Lin, M Zhang and J F Scott Appl. Phys. Lett. 90 262908 (2007)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Dash, P., Dash, B.N., Rath, H. et al. Evolution of phase purity and texture on annealing of BiFeO3 thin film prepared by sol-gel technique. Indian J Phys 83, 485–491 (2009). https://doi.org/10.1007/s12648-009-0008-0
Published:
Issue Date:
DOI: https://doi.org/10.1007/s12648-009-0008-0