Abstract
The paper presents a general algorithm for predictive metrological verification. The new algorithm is to be applied for dimensional control done with a measuring apparatus, regardless its area of use. Practically, the proposed method consists in a statistical analysis and a new interpretation for values what characterize the metrologca parameters: the accuracy error (scattering) and the precision error (fidelity). The theoretical studies and experimental researches were focused to identity the actual causes for the downgrading of the measuring apparatus due to normal wear. It was used a combination between statistical control parameters (the arithmetic mean and root-mean-square deviation (standard deviation)), and metrological characteristics (the accuracy error and precision error). The new algorithm for the predictive metrological verification allows the parameters dynamics observation. The user can forecast the evolution of the measuring apparatus qualitative characteristics. Thus, it can be discovered if the apparatus is damaged or simply it was taken out from its accuracy class due of normal wear.
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Nani, VM. A New Algorithm for Predictive Metrological Verification of Measuring Apparatus. Int. J. Precis. Eng. Manuf. 19, 167–172 (2018). https://doi.org/10.1007/s12541-018-0019-x
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DOI: https://doi.org/10.1007/s12541-018-0019-x