Abstract
The paper reports the measurement of refractive indices and anisotropic absorption coefficients of biaxial potassium titanyl phosphate (KTP) crystal in the form of thin plate using reflection ellipsometry technique. This experiment is designed in the Graduate Optics Laboratory of the Addis Ababa University and He-Ne laser (λ = 632.8 nm), diode laser (λ = 670.0 nm) and temperature-tuned diode laser (λ = 804.4 and 808.4 nm), respectively have been employed as source. The experimental data for n x , n y are fitted to the Marquardt-Levenberg theoretical model of curve fitting. The obtained experimental data of refractive indices are compared with different existing theoretical and experimental values of KTP crystals and found to be in good agreement with them.
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References
B Hilezer and S Balanicka, Phys. Status Solidi B19, 717 (1973)
M Born and E Wolf, Principles of optics (Pergamon Press, New York, 1987)
V Marinova and M Veleva, Opt. Mater. 19(3), 329 (2002)
M V R S Murthy and R P Shukla, Opt. Eng. 22(2), 227 (1983)
R P Shukla, G M Perera, M C George and P Venkateswerlu, Opt. Commun. 78(1), 7 (1990)
R M A Azzam and N M Bashara, Ellipsometry and polarized light (North Holland Publishers, Amsterdam, 1977)
H J Peng, Z T Liu, H Y Chau, Y L Ho, B Z Tang, M Wong, H C Huang and H S Kwok, J. Appl. Phys. 92(10), 5735 (2002)
J N Hilfiker, Spectroscopic ellipsometry (SE) for materials characterization at 193 and 157 nm, Semiconductor Fabtech, 17th edition
M Schubert and W Dollase, Opt. Lett. 27(23), 2073 (2002)
F Xiong, R P H Chang, M E Hagerman, V L Kozhenikov, K R Poeppelmeier, H Zhou, G K Wong, J B Ketterson and C W White, Appl. Phys. Lett. 64(2), 161 (1994)
T Y Fan, C E Huang, B Q Hu, R C Eckardt, Y X Fan, R L Byer and R S Feigelson, Appl. Opt. 28(12), 2390 (1987)
Optical properties of KTP crystal, http://www.castech-us.com/casktp.htm
J D Bierlin and O B Arweiler, Appl. Phys. Lett. 49, 917 (1986)
U Chatterjee, A M Rudra, P K Datta, G C Bhar and T Sasaki, J. Phys. D. Appl. Phys. 28, 275 (1995)
G C Bhar, A M Rudra, A K Chaudhary, T Sasaki and Y Mori, Appl. Phys. B63, 141 (1996)
G C Bhar, A M Rudra, U Chatterjee and A K Chaudhary, J. Phys. D: Appl. Phys. 30, 2693 (1997)
A Gebaregiorgis, Determination of optical constants of a conducting polymer using reflection ellipsometry technique, M.S. Thesis, Addis Ababa University, June 2005
K Kato, IEEE J. Quantum Electron. 27, 1137 (1991)
A Molla, Determination of optical constants of KTP crystals using reflection ellipsometry technique, M.S. Thesis, Addis Ababa University, June 2005
H Van Herzeele and J D Bierlin, J. Opt. Soc. Am. B6, 622 (1989)
D Y Zhang, H Y Shen, W Liu, G F Zhang, W Z Chen, G Zhang, R R Zeng, C H Huang, W X Lin, and J K Liang, IEEE J. Quant. Electron. 35(10), 1447 (1999)
H Liao, H Shen, Z Zheng, T Lian, Y Zhaou, C Huang, R Zeng and G Yu, Opt. Laser Technol. 20, 103 (1988)
D A Dyakov, V V Krashnikov, V I Pryalkin, M S Pshenichnikov, T B Razumikhina, V S Solomation and A I Kholodnykh, Sov. J. Quant. Electron. 18, 1059 (1988)
H Y Shen, Y P Zhou, W X Lin, Z D Zeng, R R Seng, G F Yu, C H Huang, A D Jiang, S Q Jia and D Z Shen, IEEE J. Quant. Electron. 28, 48 (1992)
D W Anthon and C D Crowder, Appl. Opt. 27, 2651 (1998)
T Y Fan, C E Huang, B Q Hu, R C Eckardt, Y X Fan, R L Byer and R S Feigelson, Appl. Opt. 26(12), 2390 (1987)
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Chaudhary, A.K., Molla, A. & Asfaw, A. Measurement of refractive index of biaxial potassium titanyl phosphate crystal plate using reflection spectroscopic ellipsometry technique. Pramana - J Phys 73, 731–741 (2009). https://doi.org/10.1007/s12043-009-0141-5
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DOI: https://doi.org/10.1007/s12043-009-0141-5