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Controlling Ag3Sn plate formation in near-ternary-eutectic Sn-Ag-Cu solder by minor Zn alloying

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  • Lead-Free Solder
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Abstract

As a result of extensive studies, nearternary-eutectic Sn-Ag-Cu (SAC) alloys have been identified as the leading lead-free solder candidates to replace lead-bearing solders for ball-grid array module assembly. However, recent studies revealed several potential reliability risk factors associated with the alloy system. The formation of large Ag3Sn plates in solder joints, especially when solidified at a relatively slow cooling rate, poses a reliability concern. In this study, the effect of adding a minor amount of zinc in SAC alloy was investigated. The minor zinc addition was shown to reduce the amount of undercooling during solidification and thereby suppress the formation of large Ag3Sn plates. In addition, the zinc was found to cause changes in both the microstructure and interfacial reaction of the solder joint. The interaction of zinc with other alloying elements in the solder was also investigated for a better understanding of the role of zinc during solidification of the nearternary-eutectic alloys.

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References

  1. 2002 Lead-Free Roadmap (Tokyo, Japan: Japan Electronics and Information Technology Industries Association, 2002).

  2. J. Bath, C. Handwerker, and E. Bradley: “Research Update: Lead Free Solder Alternatives,” Circuits Assembly, 11, (2000), pp. 45–52.

    Google Scholar 

  3. I.E. Anderson et al., J. Electronic Materials, 30 (2001), pp. 1050–1059.

    CAS  Google Scholar 

  4. K.W. Moon et al., J. of Electronic Materials, 29 (2000), pp. 1122–1136.

    Article  CAS  Google Scholar 

  5. I. Ohnuma et al., J. of Electronic Materials, 29 (2000), pp. 1137–1144.

    Article  CAS  Google Scholar 

  6. D.R. Frear et al., JOM, 53 (6) (2001), pp. 28–32.

    Article  CAS  Google Scholar 

  7. K.S. Kim, S.H. Huh, and K. Suganuma, Materials Science and Engineering, A333 (2002), pp. 106–114.

    CAS  Google Scholar 

  8. D.W. Henderson et al., J. of Materials Research, 17 (11) (2002), pp. 2775–2778.

    Article  CAS  Google Scholar 

  9. S.K. Kang et al., Proc. 53rd ECTC (Piscataway, NJ: IEEE, 2003), pp. 64–70.

    Google Scholar 

  10. S.K. Kang et al., JOM, 55 (6) (2003), pp. 61–65.

    Article  CAS  Google Scholar 

  11. K.L. Buckmaster et al. (Paper presented at the 2003 TMS Fall Meeting, Chicago, November 2003).

  12. S.K. Kang et al. (Paper presented at 2004 TMS Annual Meeting, Charlotte, NC, March 2004).

  13. A. Ohno and T. Motegi, J. of Japan Inst Metals, 37 (1973), pp. 777–780.

    CAS  Google Scholar 

  14. P. Lauro et al., J. Electronic Materials, 32 (12) (2003), pp. 1432–1440.

    Article  CAS  Google Scholar 

  15. S.K. Kang et al., Proc. 52nd ECTC (Piscataway, NJ: IEEE, 2002), pp. 147–153.

    Google Scholar 

  16. P. Harris, Surface Mount Tech. (U.K.) 11 (3) (1999), pp. 46–52.

    Article  CAS  Google Scholar 

  17. S.K. Kang et al., to be published in Materials Transactions (The Japan Inst. Metals in 2004).

  18. S.K. Kang et al., to be published in Proc. Electronic Comp. Tech. Conf. (Piscataway, NJ: IEEE, June 2004).

    Google Scholar 

  19. K. Zeng and K.N. Tu, Materials Sci. & Eng., R 38 (2002), pp. 55–105.

    Article  Google Scholar 

Download references

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For more information, contact Sung K. Kang, IBM T.J. Watson Research Center, 1101 Kitchawan Road, Route 134, P.O. Box 218, Yorktown Heights, NY 10598; (914) 945-3932; fax (914) 945-2141; e-mail kang@us.ibm.com.

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Kang, S.K., Shih, DY., Leonard, D. et al. Controlling Ag3Sn plate formation in near-ternary-eutectic Sn-Ag-Cu solder by minor Zn alloying. JOM 56, 34–38 (2004). https://doi.org/10.1007/s11837-004-0108-4

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  • DOI: https://doi.org/10.1007/s11837-004-0108-4

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