Abstract
TiN coatings on Al2O3 substrates were fabricated by vacuum cold spray (VCS) process using ultrafine starting ceramic powders of 20 nm in size at room temperature (RT). Microstructure analysis of the samples was carried out by scanning electron microscopy, transmission electron microscopy, and x-ray diffraction. Sheet resistance of the VCS TiN coatings was measured with a four-point probe. The effects of microstructure on the electrical properties of the coatings were investigated. It was found that the sheet resistance and electrical resistivity of TiN coatings were significantly associating with the spray distance, nozzle traversal speed, and deposition chamber pressure. A minimum sheet resistance of 127 Ω was achieved. The microstructural changes can be correlated to the electrical resistivity of TiN coatings.
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The project was supported by National Natural Science Foundation of China (Contract No.: 50705075).
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This article is an invited paper selected from presentations at the 4th Asian Thermal Spray Conference (ATSC 2009) and has been expanded from the original presentation. ATSC 2009 was held at Nanyang Hotel, Xi’an Jiaotong University, Xi’an, China, October 22-24, 2009, and was chaired by Chang-Jiu Li.
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Wang, YY., Liu, Y., Yang, GJ. et al. Effect of Microstructure on the Electrical Properties of Nano-Structured TiN Coatings Deposited by Vacuum Cold Spray. J Therm Spray Tech 19, 1231–1237 (2010). https://doi.org/10.1007/s11666-010-9541-9
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DOI: https://doi.org/10.1007/s11666-010-9541-9