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The creep behavior of In-Ag eutectic solder joints

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Abstract

The addition of 3 wt.% Ag to In results in a eutectic composition with improved mechanical properties while only slightly lowering the melting temperature. Steady-state creep properties of In-Ag eutectic solder joints have been measured using constant load tests at 0, 30, 60, and 90°C. Constitutive equations are derived to describe the creep behavior. The data are well represented by an equation of the form proposed by Dorn: a power-law equation applies to each independent creep mechanism. Two parallel mechanisms were observed for the In-Ag eutectic joints. The high-stress mechanism is a bulk mechanism with a thermal dependence dominated by the thermal dependence of creep in the Inrich matrix. The low-stress mechanism is a grain boundary mechanism. Results of this work are discussed with regard to creep behavior of typical eutectic systems.

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References

  1. Z. Mei, R. Hansen, M.C. Shine and J.W. Morris, Jr., J. Electron. Packaging 113, 109 (1991).

    Google Scholar 

  2. D. Grivas, K.L. Murty and J.W. Morris, Jr., Acta Met. 27, 731 (1979).

    Article  CAS  Google Scholar 

  3. H.E. Cline and T.H. Alden, Trans. AIME 239, 710 (1967).

    CAS  Google Scholar 

  4. Z. Mei and J.W. Morris, Jr., J. Electronic Mater. 21, 599 (1992).

    CAS  Google Scholar 

  5. Z. Mei, J.W. Morris, Jr., M.C. Shine and T.S.E. Summers, J. Electron. Mater. 20, 599 (1991).

    CAS  Google Scholar 

  6. Z. Mei and J.W. Morris, Jr., ASME Winter Meeting, Atlanta, Georgia (1991).

  7. J.C. Wei, Ph.D Thesis, Stanford University, (1981).

  8. R. Darveaux, and I. Turlick, IEEE Trans. on Components, Hybrids and Manu. Tech. 13, 929, December (1990).

    Article  CAS  Google Scholar 

  9. J.L. Freer Goldstein and J.W. Morris, Jr., Metall. Trans. A 25A, 2715 (1994).

    Google Scholar 

  10. F. Bartels, H.L. Reynolds and J.W. Morris, Jr., unpublished work.

  11. J.L.F. Goldstein, Ph.D. Thesis, University of California at Berkeley, (1993); and J.W. Morris, Jr., J.L. Freer Goldstein and Z. Mei, JOM 45, 25 (1993).

  12. J.E. Bird, A.J. Mukherjee and J.E. Dorn, Quantitative Relation Between Properties and Microstructure, (Israel University Press, 1969), p. 255.

  13. J.W. Morris, Jr., J.L. Freer Goldstein and Z. Mei, The Mechanics of Solder Alloy Interconnects, ed. S.N. Burchett, D.R. Frear, H.S. Morgan and J.H. Lau, (New York: Van Nostrand Reinhold, 1993).

    Google Scholar 

  14. R.E. Frenkel, M.S. Thesis, University of California, Berkeley, (1954).

    Google Scholar 

  15. J.E. Dorn, Creep and Recovery, (Materials Park, OH: ASM Intl., 1957), p. 255.

    Google Scholar 

  16. J. Weertman, Trans. AIME 218, 207 (1960).

    CAS  Google Scholar 

  17. R. Darveaux, E. Yung, I. Turlik and K.L. Murty, Mater. Res. Soc. Symp. Proc., 203, (Pittsburgh, PA: Mater. Res. Soc., 1991), p. 443.

    Google Scholar 

  18. F. Garofalo, Trans. AIME 227, 351 (1963).

    Google Scholar 

  19. C.M. Sellars and W.J. McG. Tegart, Mem. Sci. Rev. Met. 63, 731 (1966).

    CAS  Google Scholar 

  20. W.A. Wong and J.J. Jonas, Trans. AIME 242, 2271 (1968).

    CAS  Google Scholar 

  21. H.J. Frost and M.F. Ashby, Deformation-Mechanism Maps: The Plasticity and Creep of Metals and Ceramics, (New York: Pergamon Press, 1982).

    Google Scholar 

  22. Z. Mei and J.W. Morris, Jr., J. Electron. Mater. 21, 401 (1992).

    CAS  Google Scholar 

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Reynolds, H.L., Kang, S.H. & Morris, J.W. The creep behavior of In-Ag eutectic solder joints. J. Electron. Mater. 28, 69–75 (1999). https://doi.org/10.1007/s11664-999-0197-5

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  • DOI: https://doi.org/10.1007/s11664-999-0197-5

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