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Experimental Study of a Thermoelectric Generation System

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Abstract

A flat wall-like thermoelectric generation system is developed for applications in exhaust heat of kilns. The design of the whole experimental setup is presented. The essential performance of the thermoelectric generation system is tested, including open-circuit voltage, output power, and system conversion efficiency. The results illustrate that, when heat source insulation is not considered, the system conversion is efficient at hot-side temperatures between 120°C and 150°C. In addition, the nonuniformity of heat transfer is found to significantly affect the power-generating ability of the system. System-level simulation is carried out using a quasi-one-dimensional numerical model that enables direct comparison with experimental results. The results of both experiment and simulation will provide a foundation to improve and optimize complex thermoelectric generation systems.

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Authors and Affiliations

  1. R&D Center, Fuxin Electronic Technology Co., Ltd., No. 20 Keyuan Road 3, Ronggui, District Shunde, Fushan, 528306, Guangdong, People’s Republic of China

    Junpeng Zhu & Jianzhong Zhang

  2. School of Mechanical and Auto Engineering, South China University of Technology, Wushan Road, Tianhe District, Guangzhou, 510641, People’s Republic of China

    Junling Gao & Qungui Du

  3. Hebei University of Science and Technology, Yuhua East Road, Shijiazhuang, 050018, People’s Republic of China

    Junling Gao

  4. Institute of Energy Technology, Aalborg University, Pontoppidanstraede 101, 9220, Aalborg, Denmark

    Min Chen & L. A. Rosendahl

  5. Department of Material Science, Graduate School of Engineering, Hokkaido University, N13W8 Kita-ku, Sapporo, Hokkaido, 060-8628, Japan

    R. O. Suzuki

Authors
  1. Junpeng Zhu
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  2. Junling Gao
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  3. Min Chen
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  4. Jianzhong Zhang
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  5. Qungui Du
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  6. L. A. Rosendahl
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  7. R. O. Suzuki
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Correspondence to Junpeng Zhu.

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Zhu, J., Gao, J., Chen, M. et al. Experimental Study of a Thermoelectric Generation System. J. Electron. Mater. 40, 744–752 (2011). https://doi.org/10.1007/s11664-011-1536-x

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  • DOI: https://doi.org/10.1007/s11664-011-1536-x

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