Abstract
Intermetallic compounds formed during the soldering reactions between Sn-3.5Ag and Cu at temperatures ranging from 250°C to 375°C are investigated. The results indicate that scallop-shaped η-Cu6(Sn0.933 Ag0.007)5 intermetallics grow from the Sn-3.5Ag/Cu interface toward the solder matrix accompanied by Cu dissolution. Following prolonged or higher temperature reactions, ɛ-Cu3 (Sn0.996 Ag0.004) intermetallic layers appear behind the Cu6(Sn0.933 Ag0.007)5 scallops. The growth of these interfacial intermetallics is governed by a kinetic relation: ΔX=tn, where the n values for η and ɛ intermetallics are 0.75 and 0.96, respectively. The mechanisms for such nonparabolic growth of interfacial intermetallics during the liquid/solid reactions between Sn-3.5Ag solders and Cu substrates are probed.
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Chuang, T.H., Wu, H.M., Cheng, M.D. et al. Mechanisms for interfacial reactions between liquid Sn-3.5Ag solders and cu substrates. J. Electron. Mater. 33, 22–27 (2004). https://doi.org/10.1007/s11664-004-0289-1
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DOI: https://doi.org/10.1007/s11664-004-0289-1