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J. Electron. Mater. 31(5)(2002), pp.370–375.
The online version of the original article can be found at http://dx.doi.org/10.1007/s11664-002-0085-8
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Stahlbush, R.E., Fatemi, M., Fedison, J.B. et al. Stacking-fault formation and propagation in 4H-SiC PiN diodes. J. Electron. Mater. 31, 827 (2002). https://doi.org/10.1007/s11664-002-0245-x
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DOI: https://doi.org/10.1007/s11664-002-0245-x