Abstract
In an attempt to develop a thermally stable solder system, an in-situ Pb-Sn solder composite reinforced with Cu6Sn5 dispersoids was investigated for its thermal stability. The stability was evaluated mainly by measuring the growth rate of intermetallics at in-situ composite solder/BLM interface as a function of the number of reflow soldering cycles and aging time. The rates were compared with those of the eutectic Pb-Sn and Sn-Ag solders. After the thermal treatments, the solder joints were tested for their shear strengths. The results indicated that the in-situ composite solder has a higher shear strength and better thermal stability than the eutectic Pb-Sn solder.
Similar content being viewed by others
References
K.G. Schmitt-Thomas and S. Wedg, Brazing and Soldering 11, 27 (1986).
R.N. Wild, Welding J. (Res. Suppl.) 51, 521s (1972).
W.M. Wolverton, Brazing and Soldering 12, 33 (1987).
D.R. Frear and W.B. Jones, Proc. NEPCON West 90, 1324 (1990).
D.R. Frear, Solder Mechanics (A State of the Art Assessment), ed. D.R. Frear, W.B. Jones and K.R. Kinsman (Warrendale, PA: TMS, 1991), p. 191.
B. Irving, Welding J. October, 54 (1991).
J.A. Wasynczuk and G.K. Lucey, Proc. NEPCON West 92, 1245 (1992).
R.B. Clough et al., Proc. NEPCON West 92, 1256 (1992).
J.L. Marshall, J.A. Sees, and J. Calderon, Proc. NEPCON West 92, 1278 (1992).
R.F. Pinizzotto et al., J. Electron. Mater. 22, 769 (1993).
H.S. Betrabet, S.M. MacGee, and J.K. Mckinlay, Scripta Metall. 25, 2323 (1991).
S.M.L. Sastry et al., Proc. NEPCON West 92, 1266 (1992).
R.C. Reno, M.J. Panunto, and B.H. Piekarski, J. Electron. Mater. 26, 11 (1997).
C.T. Ho and D.D.L. Chung, J. Mater. Res. 5, 1266 (1990).
S. Jin and M. McCormack, J. Electron. Mater. 23, 735 (1994).
H. Mavoori and S. Jin, Appl. Phys. Lett. 73, 2290 (1998).
J.H. Lee, D.J. Park, J.N. Heo, Y.H. Lee, D.H. Shin, and Y.S. Kim, Scripta Mater. accepted for publication.
S.M.L. Sastry, D.R. Frear, G. Kuo, and K.L. Jerina, The Mechanics of solder Alloy Wetting and Spreading, ed. F.G. Yost, F.M. Hosking, and D.R. Frear (New York: Van Nostrand Reinhold, 1993), p. 25.
H.K. Kim and K.N. Tu, Phys. Rev. B 53, 16027 (1996).
M. Schaefer, W. Laub, R.A. Fournelle, and J. Liang, Design & Reliability of Solders and Solder Interconnections, ed. R.K. Mahidhara, D.R. Frear, S.M.L. Sastry, K.L. Murty, P.K. Liaw, and W.L. Winterbottom (Warrendale, PA: TMS, 1997), p. 247.
M. Schaefer, R.A. Fournelle, and J. Liang, J. Electron. Mater. 27, 1167 (1998).
S.K. Kang and V. Ramachandran, Scrpita Metall. 14, 421 (1980).
P.W. Dehaven, Mater. Res. Soc. Symp. Proc. 40, 123 (1985).
D.W. Kang et al., J. Electron. Mater. will submit for publication.
H.D. Blair, T-Y Pan, and J.M. Nicholson, 48th Electron. Components and Technol. Conf. (Piscataway, NJ: IEEE, 1998).
Author information
Authors and Affiliations
Additional information
Jointly appointed by CAAM at POSTECH
Rights and permissions
About this article
Cite this article
Lee, JH., Park, D., Moon, JT. et al. Reliability of composite solder bumps produced by an in-situ process. J. Electron. Mater. 29, 1264–1269 (2000). https://doi.org/10.1007/s11664-000-0022-7
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/s11664-000-0022-7