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Statistical Quantification of the Impact of Surface Preparation on Yield Point Phenomena in Nickel

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Abstract

Nanoindentation was used to evaluate the effect of three surface preparation techniques—mechanical polishing, electropolishing, and ion polishing—on experimental measurements of incipient plasticity in commercially pure Ni 200. Surface preparation techniques are linked to defect densities, estimated with image quality (IQ) and kernel average misorientation (KAM) data obtained from electron backscatter diffraction patterns and the Taylor relation. Minimum yield pressures are insensitive to surface preparation, while mean yield pressure depends on dislocation density, and the maximum yield pressure is likely influenced by defects other than dislocations. KAM coupled with IQ may be a useful non-destructive parameter to relate surface defect density to the resulting changes in the spatial variability of incipient plasticity during a nanoindentation experiment. This analysis makes the assumption that geometrically necessary dislocation density is proportional to total dislocation density; in cases where this condition is not satisfied, the KAM analysis may not be valid.

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Acknowledgments

This research was supported by the National Science Foundation under grant NSF/CMMI 1030843 (SKL, DFB and HMZ). The authors would like to thank Dr. David P. Field for the helpful insight concerning the KAM analysis.

Author information

Author notes

  1. Samantha K. Lawrence (Ph.D. Candidate)

    Present address: School of Materials Engineering, Purdue University, 701 West Stadium Avenue, West Lafayette, IN, 47907-2045, USA

Authors and Affiliations

  1. School of Mechanical and Materials Engineering, Washington State University, P.O. Box 642920, Pullman, WA, 99164-2920, USA

    Samantha K. Lawrence (Ph.D. Candidate) & Hussein M. Zbib (Professor)

  2. Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Jahnstrasse 12, 8700, Leoben, Austria

    Megan J. Cordill (Postdoctoral) & Stefan Wurster (Group Leader)

  3. School of Materials Engineering, Purdue University, 701 West Stadium Avenue, West Lafayette, IN, 47907-2045, USA

    David F. Bahr (Professor)

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  1. Samantha K. Lawrence
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  2. Hussein M. Zbib
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  3. Megan J. Cordill
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  5. David F. Bahr
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Corresponding author

Correspondence to David F. Bahr.

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Manuscript submitted October 18, 2013.

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Lawrence, S.K., Zbib, H.M., Cordill, M.J. et al. Statistical Quantification of the Impact of Surface Preparation on Yield Point Phenomena in Nickel. Metall Mater Trans A 45, 4307–4315 (2014). https://doi.org/10.1007/s11661-014-2382-2

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  • DOI: https://doi.org/10.1007/s11661-014-2382-2

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