Abstract
As instrument technology is needed for rapid determination of the smaller, thinner and lighter specimens, more stringent demands are related to thin films such as micro-electro-mechanical systems (MEMS), dielectric coatings and electronic packaging. Therefore, the requirement for testing platforms for rapidly determine the mechanical properties of thin films is increasing. Buckling of a film/substrate system could offer a variety of applications, ranging from stretchable electronics to micro-nanoscale metrology. In this paper, a fatigue-loading device has been designed to make the cyclic loading available for investigating the cumulative propagation of thin film buckling. The straight side buckling of thin compressed titanium film with the thickness of 50 nm deposited on organic glass substrates is investigated by using an optical microscope. The cumulative buckling propagation under the cyclic loading of a sequence of peak compression with the frequency 1 Hz is recorded by CCD camera. The buckling extension lengths are calculated by digital image measurement technology.
Similar content being viewed by others
References
Hutchinson J W, Suo Z. Mixed mode cracking in layered materials. Adv Appl Mech, 1992, 29: 63–191
Hutchinson J W, He M Y. The influence of imperfections on the nucleation and propagation of buckling driven delaminations. J Mech Phys Solids, 2000, 43(4): 709–734
He M Y, Evans A G. Effects of morphology on the decohesion of compressed thin films. Mater Sci Eng A, 1998, 245(2): 168–181
Jensen H M, Sheinman I. Straight-sided, buckling -driven delamination of thin films at high stress levels. Int J Fract, 2001, 110(4): 371–385
Hutchinson J W, Suo Z. Interface crack between two elastic layers. Int J Fract, 2004, 43(1): 0376–9429
Choi S R, Hutchinson J W, Evans A G. Delamination of multilayer thermal barrier coatings. Mech Mater, 1999, 31(7): 431–447
Jensen H M, Sheinman I. Numerical analysis of buckling-driven delamination. Int J Solids Struct, 2002, 39: 3373–3386
Wang S B, Fang Y Z, Jia H K, et al. A new application of digital image processing to investigate thin compressed films: The measurement of buckling propagation. Opt Laser Eng, 2010, 48: 1140–1144
Coupeau C. From thin film and coating buckling structures to mechanical properties. Mater Sci Eng A, 2008, 483-484: 617–619
Thouless M D, Hutchinson J W, Liniger E G. Plane-strain, buckling-driven delamination of thin films: Model experiments and mode-II fracture. Acta Mater, 1992, 40(10): 2639–2649
Wang S B, Jia H K, Ren X C, et al. Optical 3D shape measurement for nano-scale thin film buckle. In: International Conference on Experimental Mechanics 2008. Proc SPIE, 2009. 7375: 73755L
Wang S B, Xiao Y, Jia H K, et al. Experimental research on buckling of thin films in nano-scale under mechanical and thermal loading. In: International Conference on Experimental Mechanics 2008, Proc SPIE, 2009. 7375: 73753B
Song J, Jiang H, Liu Z J, et al. Buckling of a stiff thin film on a compliant substrate in large deformation. Int J Solids Struct, 2008, 45: 3107–3121
Jiang H, Sun Y, Rogers J A, et al. Post-buckling analysis for the precisely controlled buckling of thin film encapsulated by elastomeric substrates. Int J Solids Struct, 2008, 45: 2014–2023
Jiang H, Khang D, Fei H, et al. Finite width effect of thin-films buckling on compliant substrate: Experimental and theoretical studies. J Mech Phys Solids, 2008, 56: 2585–2598
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Wang, S., Jia, H., Li, L. et al. Experimental investigation on cumulative propagation of thin film buckling under cyclic load. Sci. China Technol. Sci. 54, 1371–1375 (2011). https://doi.org/10.1007/s11431-011-4409-x
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11431-011-4409-x