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Experimental and Numerical Methods for Exact Subpixel Shifting

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Abstract

An approach to quantifying the errors in digital image correlation (DIC) is presented using experimentally produced images. The challenge arises in creating exact subpixel shifted images in an experiment. This was accomplished via numerical binning of an ultra-high resolution image. The shifted images are then used for a preliminary analysis of 2D correlation software uncertainty and investigation of speckle pattern quality. Because it is often necessary to use numerically shifted images, for uncertainty quantification for instance, the optimum method of Fourier shifting is also presented.

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Acknowledgements

I would like to thank Prof. Mike Sutton and Dr. Hubert Schreier for many fruitful discussions on these results and their interpretation. I would also like to thank my reviewers David Epp and Timothy Miller for the valuable comments. This acknowledgement does not however, imply their complete agreement or endorsement of the interpretation of the results.

Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy under contract DE-AC04-94AL85000.

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  1. Sandia National Laboratory, Albuquerque, NM, 87185, USA

    P. L. Reu (SEM member)

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  1. P. L. Reu
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Correspondence to P. L. Reu.

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Reu, P.L. Experimental and Numerical Methods for Exact Subpixel Shifting. Exp Mech 51, 443–452 (2011). https://doi.org/10.1007/s11340-010-9417-4

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  • DOI: https://doi.org/10.1007/s11340-010-9417-4

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