An optoelectronic method of contactless reconstruction of the surface profile of complexly shaped threedimensional objects with the use of structured light, phase triangulation, and a steady-state method of identification of interference patterns by means of stepwise shift is considered. Analytic estimates as well as estimates obtained experimentally (using the newly developed measurement system) of the error in measurements of surface profile with the use of the proposed method are presented.
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Translated from Metrologiya, No. 4, pp. 15–27, April, 2010.
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Dvoynishnikov, S.V., Kulikov, D.V. & Meledin, V.G. Optoelectronic method of contactless reconstruction of the surface profile of complexly shaped three-dimensional objects. Meas Tech 53, 648–656 (2010). https://doi.org/10.1007/s11018-010-9556-0
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DOI: https://doi.org/10.1007/s11018-010-9556-0