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The diffusion of Pt in BST films on Pt/Ti/SiO2/Si substrate by sol-gel method

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Abstract

Barium strontium titanate (Ba0.65Sr0.35TiO3) ferroelectric thin films have been prepared by sol-gel method on Pt/Ti/SiO2/Si substrate. The X-ray diffraction (XRD) pattern indicated that the films were a polycrystalline perovskite structure and the atomic force microscope (AFM) image showed that the crystallite size and the root mean square roughness (RMS) were 90 nm and 3.6 nm, respectively. The X-ray photoelectron spectrum (XPS) images showed that Pt consisting in BST thin films was the metallic state, and the Auger electron spectroscopy (AES) analysed the Pt concentration in different depth profiles of BST thin films. The result displayed that the Pt diffusion in BST thin film is divided into two regions: near the BST/Pt interface, the diffusion type was volume diffusion, and far from the interface correspondingly, the diffusion type became grain boundary diffusion. In this paper, the previous researcher’s result was used to verify our conclusion.

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Authors and Affiliations

  1. School of Micro-electronics & Solid-state Electronics, University of Electronic Science and Technology of China, Chengdu, 610054, P.R.China

    Wencheng Hu, Chuanren Yang, Wanli Zhang, Guijun Liu & Dong Dong

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  1. Wencheng Hu
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  2. Chuanren Yang
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  3. Wanli Zhang
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  4. Guijun Liu
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  5. Dong Dong
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Correspondence to Wencheng Hu.

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Hu, W., Yang, C., Zhang, W. et al. The diffusion of Pt in BST films on Pt/Ti/SiO2/Si substrate by sol-gel method. J Sol-Gel Sci Technol 39, 293–298 (2006). https://doi.org/10.1007/s10971-006-7809-9

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  • DOI: https://doi.org/10.1007/s10971-006-7809-9

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