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Elemental content in deionized water by total-reflection X-ray fluorescence spectrometry

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Abstract

This study aimed to evaluate minor and trace elements in the water during different water purification steps of a deionized water production plant, located at CENA, by total-reflection X-ray fluorescence (TXRF) technique, using Ga as internal standard for elemental quantification. This approach was capable of determining Cr, Mn, Fe, Co, Ni, Cu, Zn, Ge, As, Se, Br, Rb at concentrations higher than 40–100 μg L−1, and for K, Ca, Sc, Ti, V and Sr at concentrations higher than sub mg L−1 in the water samples. TXRF spectrometer encompasses an X-ray tube with a Mo target with a Zr filter. The elemental characteristic X-rays were recorded by a Si(Li) semiconductor detector and the X-ray spectra deconvoluted by AXIL software.

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Authors and Affiliations

  1. Center for Nuclear Energy in Agriculture (CENA), University of São Paulo (USP), Av. Centenário, 303, Caixa Postal 96, CEP 13400-970, Piracicaba, SP, Brazil

    G. A. Tavares, E. Almeida, J. G. G. de Oliveira, J. A. Bendassolli & V. F. Nascimento Filho

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  1. G. A. Tavares
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  2. E. Almeida
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  3. J. G. G. de Oliveira
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  4. J. A. Bendassolli
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  5. V. F. Nascimento Filho
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Correspondence to G. A. Tavares.

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Tavares, G.A., Almeida, E., de Oliveira, J.G.G. et al. Elemental content in deionized water by total-reflection X-ray fluorescence spectrometry. J Radioanal Nucl Chem 287, 377–381 (2011). https://doi.org/10.1007/s10967-010-0885-x

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  • DOI: https://doi.org/10.1007/s10967-010-0885-x

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