Abstract
Ionization detectors, based on the drift and collection of charges in high purity Germanium crystals (HP-Ge), are commonly used for gamma and particle detection. In the field of very low temperature detectors, several major experiments, like EDELWEISS or CDMS, are using such devices combined with a simultaneous measurement of the detector heat pulses, to search for dark matter in the universe. The leakage current between the charge collecting electrodes of the detectors must be kept as low as possible to preserve performance in terms of high resolution and low threshold. We present results concerning the surface treatment of EDELWEISS HP-Ge crystals, aiming at the reduction of their leakage currents at temperatures below 4 K. Among the explored solutions, a post-process dry-etching using XeF\(_{2}\) (xenon difluoride) gives very promising and reproducible results. The modification of the Ge surface by this treatment and its effect on the low temperature leakage currents are discussed.
Similar content being viewed by others
References
E. Armengaud et al., EDELWEISS collaboration. Phys. Lett. B 702, 329 (2011)
P.B. Chu, J.T. Chen, R. Yeh, G. Lin, J.C.P. Huang, B.A. Warneke, K. Pister, Solid-State Sensors & Actuators. 1997 International Conference TRANDUCERS ’97 (1997)
G.D. Cole, Y. Bai, M. Aspelmeyer, E.A. Fitzgeral, Appl. Phys. Lett. 96, 261102 (2010)
G. Xuan, T.N. Adam, P.-C. Lv, N. Sustersic, M.J. Coppinger, J. Kolodzey, J. Suehle, E. Fitzerald, J. Vac. Sci. Technol. A 26(3), 385 (2008)
K. Sugano, O. Tabata, in Micromechatronics and Human Science, 2002 International Symposium on Micromechatronics and Human, Science (2002), pp 47–52
J. Gascon, N. Bastidon, in The proceedings of LTD-15 (Special Issue of the Journal of Low Temperature Physics)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Marnieros, S., Bergé, L., Broniatowski, A. et al. Controlling the Leakage-Current of Low Temperature Germanium Detectors Using XeF\(_{2}\) Dry Etching. J Low Temp Phys 176, 182–187 (2014). https://doi.org/10.1007/s10909-013-0997-0
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10909-013-0997-0