Scanning electron microscopy and energy dispersive X-ray study of a recovered dental implant

Abstract

A recovered dental implant has been studied for surface contamination using SEM and EDS microanalysis. The implant had been in place for 4 years in an adult male (age: 56 years), who had poor oral hygiene and was a smoker. Loosening had occurred, and the implant was removed accidentally during the taking of an impression. Using SEM, three distinct regions were identified, a clear one where the metal appeared shiny and unaffected, a discoloured one, where the surface appeared smooth and uncoated, and a region where there was a distinct deposit. All three regions gave elemental compositions of approximately 85% Ti, 12% Al, 3% V, which is a little richer in aluminium than the nominal overall composition of the usual alloy employed in implants. All three regions showed the presence of carbon, with the highest levels being associated with the surface deposit, and the lowest with the clear region. Oxygen was also present in substantial amounts, with most being found in the discoloured region. No nitrogen was detected, which suggests that the organic surface contamination is not due to interaction with proteins, despite their presence in saliva and crevicular fluid within the mouth.