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The investigation of frequency dependent dielectric properties and ac conductivity by impedance spectroscopy in the Al/(Cu-doped Diamond Like Carbon)/Au structures

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Abstract

In order to perform metal-interlayer-semiconductor (MIS) Schottky diodes (SDs) with a greater barrier height (BH), various materials are used at M/S interface as interlayer. Here, the interlayer material's characteristics are crucial, notably the need for characteristics like substrate adhesion, thermal-stability, and low-resistance. Due to its exceptional qualities, diamond-like carbon (DLC), one of the favored materials, was chosen in this investigation. To create the Al/(Cu-DLC)/p-Si/Au MIS type SD in this case, a copper-doped diamond-like carbon (Cu-DLC) nanocomposite film was electrochemically formed as an interlayer. Scanning electron microscopy (SEM) was also used to evaluate the electrodeposited (Cu-DLC) film. The impedance spectroscopy (IS) technique was used to analyze the real-imaginary components of complex dielectric (ε′, ε″) and electric modulus (M′, M″), tangent-loss \((\mathrm{tan}\delta )\) and ac electrical conductivity \(({\sigma }_{ac})\) in wide range of frequency (3 kHz–3 MHz) and voltage (± 4.0 V). All these parameters derived from the impedance-measurements were found strong function of frequency and voltage at low-moderate frequencies due to a unique distribution of surface states \({(N}_{ss})\) at (Cu-DLC)/p-Si interface and interfacial/dipole polarizations. As frequency rises, M′ and M″, values rise while ε′ and ε″ values decrease.

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Data availability

The datasets generated during and/or analyzed during the current study are available from the corresponding author on reasonable request.

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The authors declare that no funds, grants, or other support were received during the preparation of this manuscript.

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Authors and Affiliations

  1. Department of Nanotechnology Engineering, Zonguldak Bulent Ecevit University, Zonguldak, Turkey

    A. Feizollahi Vahid

  2. Department of Physics, Faculty of Sciences, Çankırı Karatekin University, Çankırı, Turkey

    S. Alptekin

  3. Faculty of Aeronautics and Astronautics, Department of Avionics, İskenderun Technical University, Hatay, Turkey

    N. Basman

  4. Department of Physics, Faculty of Sciences, Gazi University, Ankara, Turkey

    M. Ulusoy, Y. Şafak Asar & Ş. Altındal

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The manuscript was written with the contributions of all authors. All authors have approved the final version of the manuscript. AFV: Investigation, measurements, writing, review & editing. SA: Investigation, measurements, writing, review & editing. NB: Investigation, measurements, writing, review & editing. MU: Investigation, measurements, writing, review & editing. YŞA: Investigation, measurements, writing, review & editing. ŞA: Investigation, writing, review & editing, supervision.

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Correspondence to Y. Şafak Asar.

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Feizollahi Vahid, A., Alptekin, S., Basman, N. et al. The investigation of frequency dependent dielectric properties and ac conductivity by impedance spectroscopy in the Al/(Cu-doped Diamond Like Carbon)/Au structures. J Mater Sci: Mater Electron 34, 1118 (2023). https://doi.org/10.1007/s10854-023-10546-z

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