Abstract
In2S3 films have been grown on glass substrates by spray pyrolysis technique. The deposition was carried out in a 300–500 °C substrate temperature and the molar ratio S/In is fixed to 2. The characteristics of these films have been determined by X-ray diffraction, energy dispersive spectroscopy, atomic force microscopy and spectrophotometer. These properties are related to the substrate temperature. X-ray diffraction spectra show that the films are polycrystalline and the obtained material is In2S3 with a cubic phase and oriented preferentially towards (400). The film grain size increases from 25 to 31 nm whereas the microstrain decreases from 4.68 × 10−3 to 3.85 × 10−3 with increasing substrate temperature. The average surface roughness passes through a minimum at 340 °C. Optical transmission of 80 % has been achieved in the visible and near infrared regions. The band gap energy has been found in the range of 2.33–2.65 eV. The static refractive index n(λ), the oscillation energy gap E0 and the dispersion energy Ed were determined by the Wemple-Didomenico model. The complex dielectric constants of In2S3 films have been calculated in the investigated wavelength range. It was found that the refractive index dispersion data obeyed to the single oscillator of the Wemple-Didomenico model, from which the dispersion parameters, the oscillation energy values and the high-frequency dielectric constant were determined. Hall effect measurements were carried out for higher substrate temperatures.
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Acknowledgments
The authors thank Dr. M. Akram Soussou (Faculté des Sciences de Gabès, Tunisie) and Professor Z. Fakhfakh (Faculté des Sciences de Sfax, Tunisie) for XRD and EDS measurements, respectively.
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Bouguila, N., Kraini, M., Timoumi, A. et al. Substrate temperature effect on properties of sprayed In2S3 films. J Mater Sci: Mater Electron 26, 7639–7648 (2015). https://doi.org/10.1007/s10854-015-3403-7
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DOI: https://doi.org/10.1007/s10854-015-3403-7