Abstract
Double-layer Pb(Zr0.53Ti0.47)O3 films were fabricated by spin coating of a sol–gel acetic-acid-based precursor solution deposited onto commercial Pt–Si substrates. The structural properties of the samples were studied by several diffraction, spectroscopy and microscopy techniques. The annealed ferroelectric films were crystallized to a pure PZT perovskite phase. A significant monoclinic phase content was found together with a relatively large tetragonal c/a ratio, according to the diffraction pattern refinement results. No traces of organic material were observed. Good film densification with relatively large grain sizes and low surface roughness was achieved. Ferroelectric domain distribution and local piezoresponse hysteresis loops were investigated by piezoresponse force microscopy. The films showed good local ferroelectric properties and a relatively large d33 piezoelectric coefficient was derived. A degree of self-polarization of the film was also found from the domain distribution-map analysis. Good macroscopic ferroelectric properties were also achieved, specially for the film with less rhombohedral content. An improved ferroelectric fatigue behavior was observed as the films proved to sustain down to 108 fatigue cycles with only a 10 % decrease of the initial remnant polarization.
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References
D.J. Taylor, Handbook of Thin Film Devices (Academic Press, London, 2000), p. 235
C.-B. Eom, S. Trolier-McKinstry, MRS Bull. 37, 1007 (2012)
N. Setter, D. Damjanovic, L. Eng, G. Fox, S. Gevorgian, S. Hong, A. Kingon, H. Kohlstedt, N.Y. Park, G.B. Stephenson, I. Stolitchnov, A.K. Taganstev, D.V. Taylor, T. Yamada, S. Streiffer, J. Appl. Phys. 100, 051606 (2006)
J.F. Scott, in Ferroelectric Random Access Memories: Fundamentals and Applications, ed. by H. Ishiwara, M. Okuyama, Y. Arimoto (Springer, Berlin, 2004), p. 3
V.N. Hung, L. Van Minh, B.T. Huyen, N.D. Minh, J. Phys: Conf. Ser. 187, 012063 (2009)
E. Bruno, F. Ciuchi, M. Castriota, S. Marino, G. Nicastro, E. Cazzanelli, N. Scaramuzza, Ferroelectrics 396, 49 (2010)
S.K. Pandey, A.R. James, R. Raman, S.N. Chatterjee, A. Goyal, C. Prakash, T.C. Goel, Phys. B 369, 135 (2005)
M.L. Calzada, in Multifunctional Polycrystalline Ferroelectric Materials. Processing and Properties. Springer Series in Materials Science, ed. by L. Pardo, J. Ricote (Springer, New York, 2011), p. 93
S. Hong, J. Woo, H. Shin, J.U. Jeon, Y.E. Pak, E.L. Colla, N. Setter, E. Kim, K. No, J. Appl. Phys. 89, 1377 (2001)
C.I. Enriquez-Flores, J.J. Gervacio-Arciniega, E. Cruz-Valeriano, P. de Urquijo-Ventura, B.J. Gutierrez-Salazar, F.J. Espinoza-Beltran, Nanotechnology 23, 495705 (2012)
S.V. Kalinin, B.J. Rodriguez, A.Y. Borisevich, A.P. Baddorf, N. Balke, H.J. Chang, L.-Q. Chen, S. Choudhury, S. Jesse, P. Maksymovych, M.P. Nikiforov, S.J. Pennycook, Adv. Mater. 22, 314 (2010)
A.L. Kholkin, V.V. Shvartsman, in Multifunctional Polycrystalline Ferroelectric Materials. Processing and Properties. Springer Series in Materials Science, ed. by L. Pardo, J. Ricote (Springer, New York, 2011), p. 409
G. Helke, K. Lubitz, in Piezoelectricity: Evolution and Future of a Technology, ed. by W. Heywang, K. Lubitz, W. Wersing (Springer, New York, 2008), p. 89
R. Mayén-Mondragón, J.M. Yánez-Limón, K.M. Moya-Canul, A. Herrera-Gomez, M. Vazquez-Lepe, F. Espinoza-Beltrán, A.M. López Beltrán, J. Mater. Sci.: Mater. Electron. 24, 1981 (2013)
L. Lutterotti, S. Gialanella, Acta Mater. 46, 101 (1998)
NIST, Engineering Statistics Handbook. http://www.itl.nist.gov/div898/handbook/
E.B. Araújo, E.C. Lima, J.D.S. Guerra, A.O. dos Santos, L.P. Cardoso, M.U. Kleinke, J. Phys.: Condens. Matter 20, 415203 (2008)
K.C.V. Lima, A.G. Souza Filho, A.P. Ayala, J. Mendes Filho, P.T.C. Freire, F.E.A. Melo, E.B. Araújo, J.A. Eiras, Phys. Rev. B 63, 184105 (2001)
D. Pandey, A.K. Singh, S. Baik, Acta Crystallogr. Sect. A 64, 192 (2008)
G. Suchaneck, D. Chvostová, J. Kousal, V. Železný, A. Lynnyk, L. Jastrabík, G. Gerlach, A. Dejneka, Thin Solid Films 519, 2885 (2011)
I. Boerasu, M. Pereira, M.J.M. Gomes, M.I.C. Ferreira, J. Optoelectron. Adv. Mater. 2, 602 (2000)
A.G. Souza Filho, K.C.V. Lima, A.P. Ayala, I. Guedes, P.T.C. Freire, F.E.A. Melo, J. Mendes Filho, E.B. Araújo, J.A. Eiras, Phys. Rev. B 66, 132107 (2002)
M. Deluca, H. Fukumura, N. Tonari, C. Capiani, N. Hasuike, K. Kisoda, C. Galassi, H. Harima, J. Raman Spectrosc. 42, 488 (2011)
J.F. Meng, R.S. Katiyar, G.T. Zou, X.H. Wang, Phys. Stat. Sol. 164, 851 (1997)
J. Rouquette, J. Haines, V. Bornand, M. Pintard, P. Papet, J.L. Sauvajol, Phys. Rev. B 73, 224118 (2006)
E. Kafadaryan, N. Aghamalyan, S. Nikogosyan, H. Shirinyan, A. Manukyan, A. Hayrapetyan, G. Badalyan, Y. Song, N. Wu, A. Ignatiev, Jpn. J. Appl. Phys. 45, 1702 (2006)
F.M. Pontes, E.R. Leite, M.S.J. Nunes, D.S.L. Pontes, E. Longo, R. Magnani, P.S. Pizani, J.A. Varela, J. Eur. Ceram. Soc. 24, 2969 (2004)
M.T. Escote, F.M. Pontes, E.R. Leite, E. Longo, R.F. Jardim, P.S. Pizani, J. Appl. Phys. 96, 2186 (2004)
E.B. Araújo, K. Yukimitu, J.C.S. Moraes, L.H.Z. Pelaio, J.A. Eiras, J. Phys.: Condens. Matter 14, 5195 (2002)
A. Bhaskar, T.-H. Chang, H.-Y. Chang, S.-Y. Cheng, Appl. Surf. Sci. 255, 3795 (2009)
R. Fernández García, Ph.D. thesis, Autonomous University of Madrid (2010)
R.J. Ong, D.A. Payne, N.R. Sottos, J. Am. Ceram. Soc. 88, 2839 (2005)
W.S. Rasband, ImageJ, U.S. National Institutes of Health, Bethesda, MD (1997–2014). http://imagej.nih.gov/ij/
A.L. Kholkin, S.V. Kalinin, A. Roelofs, A. Gruverman, in Scanning Probe Microscopy. Electrical and Electromechanical Phenomena at the Nanoscale, ed. by S.V. Kalinin, A. Gruverman (Springer Science + Business Media, New York, 2007), pp. 173–214
JPK Piezoresponse Force Microscopy (PFM). JPK Instruments. Technical note. Consulted on 04/04/2014. http://www.jpk.com/afm.230.en.html?filter_report=25
I.K. Yoo, S.B. Desu, Phys. Stat. Sol. 133, 565 (1992)
A.K. Tagantsev, I. Stolichnov, E.L. Colla, N. Setter, J. Appl. Phys. 90, 1387 (2001)
P. Gerber, A. Roelofs, C. Kügeler, U. Böttger, R. Waser, K. Prume, J. Appl. Phys. 96, 2800 (2004)
Acknowledgments
The authors are grateful to Ing. Eleazar Urbina, M. C. Araceli Mauricio, M. T. R. Flores-Farias and PhD C. I Enriquez-flores for their technical assistance. To Conacyt for the financial support through projects CB-2007-82843, Lab-2009-01-123630 and the economical support to Dra. Ma. Del Carmen Rodríguez national postdoctoral program. F. Calderon Piñar is grateful to Cinvestav, for his sabbatical stay.
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Rodríguez-Aranda, M.C., Calderón-Piñar, F., Espinoza-Beltrán, F.J. et al. Ferroelectric hysteresis and improved fatigue of PZT (53/47) films fabricated by a simplified sol–gel acetic-acid route. J Mater Sci: Mater Electron 25, 4806–4813 (2014). https://doi.org/10.1007/s10854-014-2237-z
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DOI: https://doi.org/10.1007/s10854-014-2237-z