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Structure and microwave dielectric properties of 5BaO–2V2O5 binary ceramic system

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Abstract

5BaO–2V2O5 ceramic has been prepared by conventional solid state reaction method. The X-ray diffraction and Laser Raman studies have been carried out to ascertain the phase purity and crystal structure of the prepared composition. The microwave dielectric properties of the well sintered ceramic compacts were measured by Hakki & Colemann post resonator and cavity perturbation techniques using a vector network analyzer. The 5BaO–2V2O5 ceramic exhibits a low dielectric constant of 12.1, relatively good quality factor of 26,790 GHz, and a small temperature variation of resonant frequency of 7 ppm/°C in the microwave frequency region.

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Acknowledgments

The authors are grateful to Dr. K. R. Dayas, Director, C-MET, Thrissur for extending the facilities to carry out this work. Authors are also grateful to Department of Science and Technology, New Delhi for financial support under Grant No. DST/TSG/ceramic/2009/38.

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Authors and Affiliations

  1. Centre for Materials for Electronics Technology (C-MET), Department of Information Technology, Ministry of Communication and Information Technology, Government of India, M.G. Kavu, Athani (P.O.), Thrissur, 680 771, Kerala, India

    A. N. Unnimaya, E. K. Suresh, J. Dhanya & R. Ratheesh

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  1. A. N. Unnimaya
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  2. E. K. Suresh
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  3. J. Dhanya
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  4. R. Ratheesh
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Correspondence to R. Ratheesh.

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Unnimaya, A.N., Suresh, E.K., Dhanya, J. et al. Structure and microwave dielectric properties of 5BaO–2V2O5 binary ceramic system. J Mater Sci: Mater Electron 25, 1127–1131 (2014). https://doi.org/10.1007/s10854-013-1699-8

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  • DOI: https://doi.org/10.1007/s10854-013-1699-8

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