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Ferroelectric, electrical, and magnetic properties of BiFe0.95Mn0.05O3 thin films epitaxially grown on conductive Nb:SrTiO3 and La0.7Sr0.3MnO3-buffered Nb:SrTiO3 substrates

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Abstract

BiFe0.95Mn0.05O3 (BFMO) thin films with different thicknesses have been epitaxially grown on <001>-oriented Nb-doped SrTiO3 (NbSTO) and La0.7Sr0.3MnO3(LSMO)-buffered NbSTO substrates by pulsed laser deposition. At high bias field the space-charge-limited current (SCLC) is the dominant conduction mechanism for all BFMO films while at low bias field the Ohmic conduction is the predominant mechanism. An analysis of leakage current characteristics reveals that the ferroelectric properties are critically dependent on the density of defects in BFMO films. For the BFMO/LSMO/NbSTO structure, the coercive field of the BFMO film is much smaller than that of the BFMO film directly grown on the NbSTO substrate, which is attributed to the suppression of the substrate-induced clamping effect. For both BFMO/NbSTO and BFMO/LSMO/NbSTO structures, the ferroelectric hysteresis loops show no change under a magnetic field up to 9 T, which is explained in terms of weak ferromagnetic-ferroelectric coupling in the BFMO film and the very low magnetic-field-induced electric voltage drop across the LSMO layer.

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Acknowledgments

This work was supported by the NSFC (Grant No. 51172259, 11090332), the 973 Program (Grant No. 2009CB623304), and the CAS/SAFEA International Partnership Program for Creative Research Teams.

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Authors and Affiliations

  1. State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 200050, China

    X. Q. Zhao, W. Wang, C. Zheng, Q. X. Zhu, X. M. Li & R. K. Zheng

  2. Graduate University of the Chinese Academy of Sciences, Beijing, 100049, China

    X. Q. Zhao

  3. Department of Physics, Zhejiang Normal University, Jinhua, 321004, China

    C. Zheng

Authors
  1. X. Q. Zhao
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  2. W. Wang
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  3. C. Zheng
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  4. Q. X. Zhu
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  5. X. M. Li
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  6. R. K. Zheng
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Correspondence to X. M. Li or R. K. Zheng.

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Zhao, X.Q., Wang, W., Zheng, C. et al. Ferroelectric, electrical, and magnetic properties of BiFe0.95Mn0.05O3 thin films epitaxially grown on conductive Nb:SrTiO3 and La0.7Sr0.3MnO3-buffered Nb:SrTiO3 substrates. J Mater Sci: Mater Electron 24, 1677–1684 (2013). https://doi.org/10.1007/s10854-012-0995-z

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  • DOI: https://doi.org/10.1007/s10854-012-0995-z

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