Abstract
Polycrystalline sample of Ba5SmTi3V7O30 was prepared by a high-temperature solid-state reaction technique. Structural and microstructural characterizations were performed by X-ray diffraction (XRD) and scanning electron microscopy (SEM). X-ray preliminary structural studies reveal that the material has orthorhombic structure at room temperature. Detailed electrical (dielectric and impedance) properties of the material studied by using a complex impedance spectroscopy (CIS) technique in a wide temperature range (33–450 °C) at different frequencies (102–106 Hz) reveal that the relative dielectric constant of the material increases with rise in temperature and thus bulk has a major contribution to its dielectric and electrical properties. The bulk resistance of the material decreases with rise in temperature exhibiting a typical negative temperature coefficient of resistance (NTCR) behavior. The nature of the temperature variation of conductivity and value of activation energy, suggest that the conduction process is of mixed-type (ionic–polaronic and space charge). The existence of ferroelectricity in the compound was confirmed from polarization study.
Similar content being viewed by others
References
D. Szwagierczak, J. Kulawik, J. Eur. Ceram. Soc. 24, 1979 (2004). doi:10.1016/S0955-2219(03)00358-3
H. El Alaoui-Belghiti, R. Von der Mu¨hll, A. Simon, M. Elaatmani, J. Ravez, Mater. Lett. 55, 138 (2002). doi:10.1016/S0167-577X(01)00636-X
N. Wakiya, J.K. Wang, A. Saiki, K. Shinozaki, N. Mizutani, J. Eur. Ceram. Soc. 19, 1071 (1999). doi:10.1016/S0955-2219(98)00376-8
M.R. Raju, R.N.P. Choudhary, J. Phys. Chem. Solids 64, 847 (2003). doi:10.1016/S0022-3697(02)00417-1
X.M. Chen, Z.Y. Xu, J. Li, J. Mater. Res. 15, 125 (2000). doi:10.1557/JMR.2000.0021
L.G. Van Uitert, S. Singh, H.J. Levinstein, Appl. Phys. Lett. 11, 61 (1967). doi:10.1063/1.1755079
J.J. Rubin, L.G. Van Uitert, H.J. Levinstein, J. Cryst. Growth 1, 315 (1967). doi:10.1016/0022-0248(67)90039-5
W. Wersing, Electronic ceramics, Chap 4 (Elsevier, New York, 1991)
W. Wersing, Curr. Opin. Solid State Mater. Sci. 1, 715 (1996). doi:10.1016/S1359-0286(96)80056-8
T. Negas, G. Yeager, S. Bell, R. Amren, Chemistry of electronic ceramic materials, NIST Special Publication 804, (NIST, USA, 1990)
R.J. Cava, J.J. Krajewski, R.S. Roth, Mater. Res. Bull. 33, 527 (1998). doi:10.1016/S0025-5408(98)00002-6
R. Umemura, H. Ogawa, A. Yokoi, H. Ohsato, A. Kan, J. Alloy. Comp. 424, 388 (2006). doi:10.1016/j.jallcom.2006.01.017
H. Ogawa, A. Yokoi, R. Umemura, A. Kan, J. Eur. Ceram. Soc. 27, 3099 (2007). doi:10.1016/j.jeurceramsoc.2006.11.031
P. Khatri, B. Behera, V. Srinivas, R.N.P. Choudhary, Curr. Appl. Phys. 9, 515 (2009)
Powd, E.Wn.: An interactive powder diffraction data interpretationand indexing Program, Ver 2.1, School of Physical Science, Finders University of South Australia Bedford Park,SA 5042, Australia
H.P. Klung, L.B. Alexander, X-ray diffraction procedures (Wiley, New York, 1974), p. 687
B. Harihara Venkataraman, K.B.R. Varma, J. Phys. Chem. Solids 66, 1640 (2005). doi:10.1016/j.jpcs.2005.05.076
B. Behera, P.Nayak, R.N.P. Choudhary, J. Phys. Chem. Solids 69, 1990 (2008)
P.S. Sahoo, A. Panigrahi, S.K. Patri, R.N.P. Choudhary, J. Mater. Sci.: Mater. Electron. (in press)
C. Kittel, Introduction to solid state physics, 5th edn. (Wiley, New York, 1976)
J.C. Anderson, Dielectrics (Chapman & Hall, London, 1964)
P.S. Sahoo, A. Panigrahi, S.K. Patri, R.N.P. Choudhary, Mod. Phys. Lett. B 22(30), 2999 (2008)
R.N.P. Choudhary, K.S. Singh, R. Sati, Proc. Natl. Acad. Sci. India 63(A), 567 (1993)
S. Rao, P.S.V. Rao, K. Sambasiva Rao, A. Bhanumathi, J. Mater. Sci. Lett. 6, 809 (1987). doi:10.1007/BF01729020
B. Behera, P.Nayak, R.N.P. Choudhary, Curr. Appl. Phys. 9, 201 (2009)
A.K. Jonscher, Nature 267, 673 (1977). doi:10.1038/267673a0
J. RossacDonald, Impedance spectroscopy (Wiley, New York, 1987)
J. Plocharski, W. Wieczoreck, Solid State Ion. 28, 979 (1988). doi:10.1016/0167-2738(88)90315-3
C.K. Suman, K. Prasad, R.N.P. Choudhary, Adv. Appl. Ceram. 104, 294 (2005). doi:10.1179/174367605X62580
P.B. Macedo, C.T. Moynihan, R. Bose, Phys. Chem. Glasses 13, 171 (1972)
F. Borsa, D.R. Torgeson, S.W. Martin, H.K. Patel, Phys. Rev. B 46, 795 (1992)
H. Jain, C.H. Hsieh, J. Non-Cryst. Solids 1408, 172 (1994)
S.R. Elliot, J. Non-Cryst. Solids 170, 97 (1994). doi:10.1016/0022-3093(94)90108-2
B. Roling, J. Non-Cryst. Solids 244, 34 (1999). doi:10.1016/S0022-3093(98)00847-3
B. Behera, P.Nayak, R.N.P. Choudhary, Mater. Chem. Phys. 106, 193 (2007)
S. Saha, T.P. Sinha, Phys. Rev. B 65, 134103 (2002). doi:10.1103/PhysRevB.65.134103
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Sahoo, P.S., Panigrahi, A., Patri, S.K. et al. Structural and electrical properties of Ba5SmTi3V7O30 ceramics. J Mater Sci: Mater Electron 21, 160–167 (2010). https://doi.org/10.1007/s10854-009-9887-2
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10854-009-9887-2