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Characteristics of sol–gel dip coated Ceria films

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Abstract

Cerium oxide(CeO2) thin films were deposited by the sol–gel dip coating technique using cerium chloride, acrylamide and N,N bis methylene acrylamide. The as deposited films were heat-treated at different temperatures in air. X-ray diffraction studies indicated the films to be of single phase CeO2. Optical bandgap in the range of 3.53–3.60 eV was obtained from optical studies. Laser Raman studies exhibited Raman bands around 457 cm−1.

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Authors and Affiliations

  1. Electrochemical Materials Science Division, Central Electrochemical Research Institute, Karaikudi, 630 006, India

    K. R. Murali

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  1. K. R. Murali
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Correspondence to K. R. Murali.

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Murali, K.R. Characteristics of sol–gel dip coated Ceria films. J Mater Sci: Mater Electron 19, 369–371 (2008). https://doi.org/10.1007/s10854-007-9345-y

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  • DOI: https://doi.org/10.1007/s10854-007-9345-y

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