Abstract
We report on the preparation and characterization of high purity manganese (3–9 wt.%) doped indium tin oxide (ITO, In:Sn = 90:10) films deposited by sol–gel mediated dip coating. X-ray diffraction and selected area electron diffraction showed high phase purity cubic In2O3 and indicated a contraction of the lattice with Mn doping. High-resolution transmission electron microscopy depicted a uniform distribution of ∼20 nm sized independent particles and particle induced x-ray emission studies confirmed the actual Mn ion concentration. UV-Vis diffuse reflectance measurements showed band gap energy of 3.75 eV and a high degree of optical transparency (90%) in the 100–500 nm thick ITO films. X-ray photoelectron spectroscopy core level binding energies for In 3d5/2 (443.6 eV), Sn 3d5/2 (485.6 eV) and Mn 2p3/2 (640.2 eV) indicated the In3+, Sn4+ and Mn2+ oxidation states. Magnetic hysteresis loops recorded at 300 K yield a coercivity Hc ∼ 80 Oe and saturation magnetization Ms ∼ 0.39 μB/Mn2+ ion. High-temperature magnetometry showed a Curie temperature T c > 600 K for the 3.2% Mn doped ITO film.
Similar content being viewed by others
References
H. Ohno, Science 281, 951 (1998)
Y. Matsumoto, M. Murakami, T. Shono, T. Hasegawa, T. Fukumura, M. Kawasaki, P. Ahmet, T. Chikyow, S. Koshihara, H. Koinuma, Science 291, 854 (2001)
W.K. Park, R.J. Ortega-Hertogs, J.S. Moodera, A. Punnoose, M.S. Seehra, J. Appl. Phys. 91, 8093 (2002)
N.S. Norberg, K.R. Kittilstved, J.E. Amonette, R.K. Kukkadapu, D.A. Schwartz, D.R. Gamelin, J. Am. Chem. Soc. 126, 9387 (2004)
P.V. Radovanovic, D.R. Gamelin, Phys. Rev. Lett. 91, 157202 (2003)
P. Sharma, A. Gupta, K.V. Rao, F.J. Owens, R. Sharma, R. Ahuja, J.M. Osorio Guillen, B. Johanson, G.A. Gerhing, Nat. Mater. 2, 673 (2003)
K.R. Kittilstved, D.R. Gamelin, J. Am. Chem. Soc. 127, 5292 (2005)
A. Punnoose, J. Hays, V. Shutthanandan, V. Gopal, Appl. Phys. Lett. 85, 1559 (2004); J. Hays, A. Punnoose, R. Baldner, M. Engelhard, J. Peloquin, K.M. Reddy, Phys. Rev. B. 72, 075203 (2005)
S.B. Ogale, R.J. Choudhary, J.P. Buban, S.E. Lofland, S.R. Shinde, S.N. Kale, V.N. Kulkarni, J. Higgins, C. Lanci, J.R. Simpson, N.D. Browning, S. Das Sarma, H.D. Drew, R.L. Greene, T. Venkatesan, Phys. Rev. Lett. 91, 077205 (2003)
J.M.D. Coey, M. Venkatesan, C.B. Fitzgerald, Nat. Mater. 4, 173 (2005); J.M.D. Coey, A.P. Douvalis, C.B. Fitzgerald, M. Venkatesan, Appl. Phys. Lett. 84, 1332 (2004)
H. Kimura, T. Fukumura, M. Kawasaki, K. Inaba, T. Hasegawa, H. Koinuma, Appl. Phys. Lett. 80, 94 (2002)
T. Dietl, Acta Phys. Polon. A 100, 139 (2001); T. Dietl, Semicond. Sci. Technol. 17, 377 (2002); T. Dietl, H. Ohno, F. Matsukura, Phys. Rev. B 63, 195205 (2001); T. Dietl, H. Ohno, F. Matsukura, J. Cibert, D. Ferrand, Science 287, 1019 (2000)
J. Philip, A. Punnoose, B.I. Kim, K.M. Reddy, S. Layne, J.O. Holmes, B. Satpati, P.R. Leclair, T.S. Santos, J.S. Moodera, Nat. Mater. 5, 298 (2006)
J. Philip, N. Theodoropoulou, G. Berera, J. Moodera, B. Satpati, Appl. Phys. Lett. 85, 777 (2004)
K.L. Chopra, S. Major, D.K. Pandya, Thin Solid Films 102, 1 (1983)
S.A. Bashar, Study on ITO for novel opto electronic devices, A Ph. D. thesis, University of London, 1998
P.K. Biswas, A. De, N.C. Pramanik, P.K. Chakraborty, K. Ortner, V. Hock, S. Korder, Mater. Lett. 57, 2326 (2003)
P.K. Biswas, A. De, K. Ortner, S. Korder, Mater. Lett. 58, 1540 (2004)
K. Tanaka, T. Yoko, M. Atarashi, K. Kamiya, J. Mater. Sci. Lett. 8, 83 (1989)
N.C. Pramanik, S. Das, P.K. Biswas, Mater. Lett. 56, 671 (2002)
G. McCarthy, J. Welton, Powder Diffr. 4, 156 (1989)
R.D. Shannon, C.T. Prewitt, Acta Crystallogr. Sect. B: Struct. Crystalogr. Cryst. Chem. B 25, 925 (1969)
C.D. Wagner, J.F. Moulder, L.E. Davis, W.M. Riggs, in Handbook of X-ray Photoelectron Spectroscopy, ed. By G.E. Muilenberg (Perkin-Elmer Corporation, Eden Prairie, Minnesota, 1979)
A.N.H. Al-Ajili, S.C. Bayliss, Thin Solid Films 305, 116 (1997)
Acknowledgements
The research work carried out at Boise State University was supported in part by grants from Petroleum Research Fund (AC grant, PRF#41870-AC10), National Science Foundation (DMR-MRI grant; NSF-Idaho-EPSCoR program (EPS-0447689); NSF-CAREER program (DMR-0449639)) and the Department of Energy (DoE-EPSCoR program (DE-FG02-04ER46142). The support for the work in CGCRI, India was under CTSM program [No. CMM 0022 (1)]. We thank A. Thurber for help with preliminary data collection. A portion of the research described in this paper was performed in the Environmental Molecular Sciences Laboratory, a national scientific user facility sponsored by the Department of Energy’s Office of Biological and Environmental Research and located at Pacific Northwest National Laboratory.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Reddy, K.M., Hays, J., Kundu, S. et al. Effect of Mn doping on the structural, morphological, optical and magnetic properties of indium tin oxide films. J Mater Sci: Mater Electron 18, 1197–1201 (2007). https://doi.org/10.1007/s10854-007-9277-6
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10854-007-9277-6