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Microstructural characterization of nanocrystalline nickel produced by surface mechanical attrition treatment

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Abstract

By means of surface mechanical attrition treatment (SMAT), nanocrystalline surface layers are produced in pure Ni plates. The average crystallite size, root mean square (r.m.s.) microstrain, dislocation density, and stored elastic energy are determined by X-ray diffraction (XRD) line profile analysis. The average crystallite size obtained by XRD is compared with the grain size observed from transmission electron microscopy (TEM) image. The high-resolution TEM (HRTEM) micrograph confirms the presence of high density of dislocations obtained by XRD, and reveals that most of dislocations distribute at the subgrain boundaries with few inside the subgrains.

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Acknowledgement

The present work was financially supported by the National Natural Science Foundation of China under Grant No. 50871069.

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Authors and Affiliations

  1. School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, 200093, China

    Wei Li, Ping Liu & Fengcang Ma

  2. School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China

    Wei Li & Yonghua Rong

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  1. Wei Li
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  2. Ping Liu
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  3. Fengcang Ma
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  4. Yonghua Rong
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Correspondence to Wei Li.

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Li, W., Liu, P., Ma, F. et al. Microstructural characterization of nanocrystalline nickel produced by surface mechanical attrition treatment. J Mater Sci 44, 2925–2930 (2009). https://doi.org/10.1007/s10853-009-3386-y

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