Abstract
The crystallography and texture of solid-state reactions have been studied using electron backscatter diffraction (EBSD) in a scanning electron microscope (SEM). The crystallography of both the reaction interfaces and the grain boundaries plays an important role in the kinetics of the formation of the reaction products. The growth of the reaction products is dependent upon the transport of ions through the material, which is, in turn, affected by both the orientation of the reactants and by grain boundaries in the reactants and in the reaction products. In order to predict or control the behavior of the reactions, the crystallography of all the interfaces present in the reaction must be more fully understood. In the present study, MgIn2O4 was formed by the reaction between a single-crystal MgO substrate and a thin film of In2O3 with and without an applied electric field.
Similar content being viewed by others
References
Worrell WL (1988) Solid State Ionics 28–30:1215
Julien C (2003) Solid State Ionics 157:57
Mackenzie KJD, Ryan MJ (1981) J Mater Sci 16:579
Brown IWM, Mackenzie KJD (1982) J Mater Sci 17:3663
Schmalzried H, Smolin S (1998) Ber Bunsen-Gesell-Phys Chem, Chem Phys 102:1740
Johnson MT, Schmalzried H, Carter CB (1997) Solid State Ionics 101–103:1327
Johnson MT, Gilliss SR, Carter CB (1998) Microsc Microanal 4:158
Johnson MT, Carter CB (1999) Phil Mag Lett 79:609
Korte C, Ravishankar N, Carter CB, Schmalzried H (2002) Solid State Ionics 148:111
Korte C, Farrer JK, Ravishankar N, Schmalzried H, Michael JR, Carter CB (2000) Mater Res Soc Symp Proc 586:151, MRS, Warendale, PA, Boston, MA
Schmalzried H (1995) Chemical kinetics of solids, VCH
Schmalzried H (1981) Solid state reactions, 2nd edn. Verlag Chemie
Pfeiffer T, Schmalzried H (1989) Z Phys Chem Neue Folge 161:1
Wagner C (1936) Z Phys Chem B34:309
Simpson YK, Carter CB (1987) Mater Res Soc Symp Proc 94:45
Becker KD (1994) In: d’Heurle FM, Gas P, Martin M, Philibert J (eds) Reactive formation of phases at interfaces and diffusive processes, vol 155–156. Trans Tech Publications
Kotula PG, Johnson MT, Carter CB (1998) Z Phys Chem 206:73
Wagner C (1938) Z Anorg Allgem Chem NF148:21
Schmalzried H (1962) Z Phys Chem Neue Folge 33:111
Simpson YK (1989) Grain Boundaries, Phase Boundaries and Reactions in Ceramic Oxides. Ph.D. Thesis, Cornell University
Kotula PG, Carter CB (1998) J Am Ceram Soc 81:2869
Kotula PG, Carter CB (1995) Proceedings of the 53rd Annual Meeting of MSA, 338
Thirsk HR, Whitmore EJ (1940) Trans Faraday Soc 36:565
Kotula PG, Carter CB (1995) Scripta Metall 32:863
Johnson MT, Carter CB (1997) Solid State Ionics 101–103:1327
Johnson MT, Carter CB (1998) Microsc Microanal 4(2):141
Senz S, Blum W, Hesse D (2001) Phil Mag A 81:109
Jing S-Y, Lin L-B, Huang N-K, Zhang J, Lu Y (2000) J Mater Sci Lett 19:225
Huang M-R, Lin C-W, Lu H-Y (2001) Appl Surf Sci 177:103
Susnitzky DW, Carter CB (1991) J Mater Res 6:1958
Kotula PG, Carter CB (1998) J Am Ceram Soc 81:2877
Johnson MT, Heffelfinger JR, Kotula PG, Carter CB (1997) J Microsc 185:225
Johnson MT, Kotula PG, Carter CB (1997) In: Pond CEA (ed) Boundaries and Interfaces in Materials: David A. Smith Symposium. Proceedings of the Memorial Symposium. TMS, Indiannapolis, 141 pp
Werner P, Sieber H, Hillebrand R, Hesse D (1997) Mater Res Soc Symp Proc 466:191, MRS, Warrendale, PA, USA, Boston, MA
Hesse D (1997) Solid State Ionics 95:1
Goehner RP, Michael JR (1996) J Res Nat Inst Standard Tech 101:301
Schwarzer RA (1996) Ultramicroscopy 67:19
Randle V (1992) Microtexture determination. The Institute of Materials
Adams BL (1997) Ultramicroscopy 67:11
Farrer JK, Carter CB, Ravishankar N (2006) J Mater Sci 41:661
Farrer JK, Carter CB (2006) J Mater Sci 41:779
Pijolat C, Riviere B, Kamionka M, Viricelle JP, Breuil P (2003) J Mater Sci 38:4333
Chopra KL (1983) Thin Solid Films 102:1
Sieber H, Senz S, Hesse D (1997) Thin Solid Films 303:216
Kamei M, Shigesato Y, Takaki S (1995) Thin Solid Films 259:38
Taga N, Odaka H, Shigesato Y, Yasui I, Kamei M, Haynes TE (1996) J Appl Phys 80:978
Tarsa EJ, English JH, Speck JS (1993) Appl Phys Lett 62:2332
Farrer JK, Michael JR, Carter CB (200) In: Schwartz AJ, Kumar M, Adams BL (eds) Electron backscatter diffraction in materials science. Kluwer Academic/Plenum Publishers, 299 pp
Michael JR (2000) In: Schwartz AJ, Kumar M, Adams BL (eds) Electron backscatter diffraction in materials science. Kluwer Academic/Plenum Publishers, 75 pp
Krieger-Lassen NC, Conradsen K, Juul Jensen D (1992) Scanning Microsc 6:115
Wright SI (2000) In: Schwartz AJ, Kumar M, Adams BL (eds) Electron backscatter diffraction in materials science. Kluwer Academic/Plenum Publishers, 51 pp
Bunge H-J (1982) Texture analysis in materials science: mathematical methods. Butterworths
Nowell MM, Wright SI (2004) J Microsc 213:296
Kotula PG, Carter CB (1993) In: Proceedings of the 2nd International Conference on Laser Ablation, Knoxville, TN, 231 pp
Acknowledgements
The authors would like to thank Prof. N. Ravishankar, Dr. Carsten Korte and Dr. Matt Johnson for extensive discussions relating to this work. The experimental part of this study was carried out at the University of Minnesota and at the laboratories of TSL in Utah. This research has been supported by the 3M Heltzer Endowed Chair and the US Department of Energy under Grant Numbers DE-FG02-92ER45465-A004 and DE-FG02-01ER45883.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Farrer, J.K., Carter, C.B. Texture in solid-state reactions. J Mater Sci 41, 5169–5184 (2006). https://doi.org/10.1007/s10853-006-0428-6
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10853-006-0428-6