Skip to main content
SpringerLink
Log in

Mapping and analysis of microscopic Seebeck coefficient distribution

  • Published:
Journal of Materials Science Aims and scope Submit manuscript

Abstract

Understanding the local Seebeck coefficient distribution is helpful for the development of novel thermoelectric materials. Seebeck coefficient distributions of both zone melted and hot pressed samples of I-doped Bi2Te3 based alloys were measured using microscopic Seebeck coefficient mapping method. Seebeck coefficient differences up to 40–50 μV/K were found between different locations on the same sample. There is no visible relationship between the microscopic Seebeck coefficient distribution and the local surface morphology and element distributions. It is suggested that the local Seebeck coefficient variations were mainly originated from the lattice defects for the zone melted sample and also due to the grain orientation for the hot pressed sample.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. B. C. Sales, Science 295 (2002) 1248.

    Article  Google Scholar 

  2. F. J. DiSalvo, Science 285 (1999) 703.

    Article  Google Scholar 

  3. T. M. Tritt, Science 283 (1999) 804.

    Article  Google Scholar 

  4. B. C. Sales, D. Mandrus and R. K. Williams, Science 272 (1996) 1325.

    Google Scholar 

  5. R. Venkatasubramanian, E. Siivola, T. Colpitts and B. O’Quinn, Nature 413 (2001) 597.

    Article  Google Scholar 

  6. T. C. Harman, P. J. Taylor, M. P. Walsh and B. E. LaForge, Science 297 (2002) 2229.

    Article  Google Scholar 

  7. D.-Y. Chung, T. Hogan, P. Brazis, M. Rocci-Lane, C. Kannewurf, M. Bastea, C. Uher and M. G. Kanatzidis, Science 287 (2000) 1024.

    Google Scholar 

  8. X. B. Zhao, X. H. Ji, Y. H. Zhang and B. H. Lu, J. Alloys Comp. 368 (2004) 349.

    Google Scholar 

  9. H.-K. Lyeo, A. A. Khajetoorians, L. Shi, K. P. Pipe, R. J. Ram, A. Shakouri and C. K. Shil, Science 303 (2004) 816.

    Article  Google Scholar 

  10. T. E. Svechnikova, P. P. Konstantinov, M. K. Zhitinskaya, S. A. Nemov, D. Platzek and E. Müller, in Proc. 7th European Workshop on Thermoelectrics (Universidad Pública de Navarra, Pamplona, Spain, 2002.)

  11. D. Platzek, A. Zuber, C. Stiewe, G. Bähr, P. Reinshaus and E. Müller, in Proc. Int. Conf. on Hermoelectrics, La Grade-Motte, France, 2003, IEEE, Piscataway, NJ 08855, USA, p. 528.

Download references

Author information

Authors and Affiliations

  1. State Key Laboratory of Silicon Materials, Zhejiang University, 310027, Hangzhou, People’s Republic of China

    H. L. Ni & X. B. Zhao

  2. Institute of Materials Research, German Aerospace Center (DLR), D-51170, Cologne, Germany

    G. Karpinski & E. Müller

Authors
  1. H. L. Ni
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. X. B. Zhao
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. G. Karpinski
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. E. Müller
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to X. B. Zhao.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Ni, H.L., Zhao, X.B., Karpinski, G. et al. Mapping and analysis of microscopic Seebeck coefficient distribution. J Mater Sci 40, 605–608 (2005). https://doi.org/10.1007/s10853-005-6296-7

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10853-005-6296-7

Keywords

Search

Navigation