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Atomic force microscopy study of the tetragonal to monoclinic transformation behavior of silica doped yttria-stabilized zirconia

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Author notes

  1. Laurent Gremillard

    Present address: National Institute of Applied Science, Materials Department, Associate Research Unit 5510 (GEMPPM), 20 av. A. Einstein, 69621, Villeurbanne, France

Authors and Affiliations

  1. Materials Science Division, LNBL, Berkeley, CA, 94720, USA

    Sylvain Deville, Jérôme Chevalier & Laurent Gremillard

Authors
  1. Sylvain Deville
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  2. Jérôme Chevalier
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  3. Laurent Gremillard
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Correspondence to Jérôme Chevalier.

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Deville, S., Chevalier, J. & Gremillard, L. Atomic force microscopy study of the tetragonal to monoclinic transformation behavior of silica doped yttria-stabilized zirconia. J Mater Sci 40, 3821–3823 (2005). https://doi.org/10.1007/s10853-005-2550-2

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  • DOI: https://doi.org/10.1007/s10853-005-2550-2

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