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The failure analyses on ZnO varistors used in high tension devices

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Abstract

The main purpose of this work is to evaluate the failure caused by electrical discharge on commercial ZnO varistor doped with oxide of Bi, Sb, Si, Cr, Co utilized in electric transmission systems. In order to observe the effect of electrical discharge over the microstructure and electrical properties of the varistors, two kinds of pulses were applied: long pulse (2000 ms) and short pulse (8/20 μs). In both cases, a decrease in grain size and increase in micropores and leakage current were observed. The degraded samples present oxygen defficiency mainly in the grain boundary and phase tranformation from the bismuth oxide phase.

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Authors and Affiliations

  1. Applied Mineralogy Group (GMA), Faculty of Mines, National University of Colombia, Cra 80 # 68-28, Medellín

    M. A. Ramírez, D. A. Bonett, J. M. Villa, M. A. Márquez & C. R. Rojo

  2. Chemistry Institute, UNESP—Paulista State University, C.P. 355, 14801-970, Araraquara, SP, Brazil

    P. R. Bueno, W. C. Ribeiro & J. A. Varela

Authors
  1. M. A. Ramírez
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  2. P. R. Bueno
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  3. W. C. Ribeiro
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  4. J. A. Varela
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  5. D. A. Bonett
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  6. J. M. Villa
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  7. M. A. Márquez
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  8. C. R. Rojo
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Correspondence to M. A. Ramírez.

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Ramírez, M.A., Bueno, P.R., Ribeiro, W.C. et al. The failure analyses on ZnO varistors used in high tension devices. J Mater Sci 40, 5591–5596 (2005). https://doi.org/10.1007/s10853-005-1366-4

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  • DOI: https://doi.org/10.1007/s10853-005-1366-4

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